Paper Citation Record · LEDGER

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation

As of 7 August 2026, this Paper Citation Record lists 44 of 44 outbound references and 1 inbound Pith citation observation for arXiv:2508.14414.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2508.14414 v1

Coverage vector

measured 44 of 44 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-05T18:37:10.226146Z

measured 45 of 45 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-07T06:34:17.273281+00:00

measured 1 of 1 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-03T03:45:39.313659Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

44 of 44 outbound references displayed

verified exact1
verified fuzzy21
unresolved22
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 090ac360-c526-4baf-acdc-7c46f567bb33 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 1

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.974890Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 12bcf11d-9ab6-4bc8-b778-23311246d6d8 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 2

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.959801Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation c03abd03-6b84-48ce-a0ce-3af648b5e336 · outbound

This paper cites Dessouky, D.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Dessouky, D

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.943558Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 00be8d51-8e26-4b23-90d3-5ad441a851f9 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 4

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.926920Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 0e4cc520-5b18-4eed-a4b3-e63b21289ebc · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 5

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.911439Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 9ceb8884-e98c-466d-a988-5db1fc3d88eb · outbound

This paper cites Ahmad, Y.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Ahmad, Y

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.896770Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 56cedca6-8522-4ba9-9a04-d158f3f2bc6a · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 7

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.881447Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 2bf56c06-781b-4114-a323-95e87d4c3457 · outbound

This paper cites Laeufer, B.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Laeufer, B

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.866396Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 1876d6b8-fa43-4350-ada9-2177ffd0ae46 · outbound

This paper cites Laeufer, J.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Laeufer, J

Reference 9

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.850487Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 6e544e66-750d-4b91-8f05-8c5d477fe4d1 · outbound

This paper cites Trippel, K.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Trippel, K

Reference 10

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.832918Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 17afe36f-9d23-4c73-9c69-05c995115eac · outbound

This paper cites Kande, A.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Kande, A

Reference 11

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.816686Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 80d5daf7-ce9d-4b9c-b731-544e4b180d14 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 12

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.800130Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 4cdeda8c-561f-44fb-925c-1c6f5cb74012 · outbound

This paper cites Abreu, P.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Abreu, P

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.783516Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 017d5c54-6ce0-4256-8b79-77e937bc7303 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 14

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.766356Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 8e5c5624-f276-4153-bd56-e881775853ae · outbound

This paper cites Xuan and M.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Xuan and M

Reference 15

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.749692Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 3dc5e598-3a78-48d9-a2d1-56cb489c2d73 · outbound

This paper cites Soremekun, L.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Soremekun, L

Reference 16

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.733687Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 2acbd9a1-9c6c-48f8-bbb1-e2cab53e876c · outbound

This paper cites DiGiuseppe and J.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation DiGiuseppe and J

Reference 17

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.717395Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation c7235faa-d8be-4a15-ba38-3422fabb0c3e · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 18

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.701577Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b83b640c-5e0e-4267-9a78-f0d2aabb71c6 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 19

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.682836Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation f87f6b57-ff51-4c52-8ce2-47e9c7c872c8 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 20

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.666741Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation fb385c77-261e-4f00-a9cc-c8cf431999f7 · outbound

This paper cites Fixing Hardware Security Bugs with Large Language Models.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Fixing Hardware Security Bugs with Large Language Models

Reference 21

Resolution: unresolved; no resolver link, observed 2026-08-05T18:37:10.124363Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e945b234-6d92-4bf7-b058-ef538095f258 · outbound

This paper cites Stracquadanio, S.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Stracquadanio, S

Reference 22

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.650698Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 44603137-5a40-40fd-aa0e-150a2c6d264f · outbound

This paper cites M \"u ller, ``Dynamic time warping,'' in Information Retrieval for Music and Motion.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation M \"u ller, ``Dynamic time warping,'' in Information Retrieval for Music and Motion

Reference 23

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.634184Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 5b3f0421-5519-43f7-acff-c8678a5cf339 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 24

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.617886Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 45cc27f6-8b90-450c-9d88-a1d0c716671f · outbound

This paper cites Canakci, L.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Canakci, L

Reference 25

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.601961Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation fd7b1de7-d565-4332-aa5d-0c0e48fe244d · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 26

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.582428Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation c69699ac-1ce8-4435-8419-3d9ee04ff948 · outbound

This paper cites Snyder, `` Verilator and SystemPerl ,'' in North American SystemC Users' Group, 2004.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Snyder, `` Verilator and SystemPerl ,'' in North American SystemC Users' Group, 2004

Reference 27

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.566416Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation a2f0bcee-42d0-4282-95d1-9ea93cc9c347 · outbound

This paper cites Vittal, `` ASIC hardware verification: Debug challenges & solutions,'' Synopsys, 2021.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Vittal, `` ASIC hardware verification: Debug challenges & solutions,'' Synopsys, 2021

Reference 28

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.549803Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation f3c28d46-6c38-4959-b51c-3cd6dec029b4 · outbound

This paper cites Papadakis and Y.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Papadakis and Y

Reference 29

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.533205Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation cfe463cb-a5d8-4037-81c2-4d9607fb566a · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 30

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.517137Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation c596c4f6-936d-4de1-b0a1-730d8a16b6e0 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 31

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.499675Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 124d24f2-abf6-4e18-ab5a-842f3f60fccb · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 32

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.483595Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 664fd96c-38cd-4834-a836-39bc679d73f0 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 33

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.468727Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation dee2a2dc-f977-4bc1-a21f-ab1f519b0ed1 · outbound

This paper cites Ahmed, F.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Ahmed, F

Reference 34

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.452664Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 7989a64b-9198-475b-a344-14d68a389857 · outbound

This paper cites Lyu and P.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Lyu and P

Reference 35

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.436369Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 0c1e3549-c97d-4a1f-b0e7-bd488ccd5590 · outbound

This paper cites LLM4DV: Using Large Language Models for Hardware Test Stimuli Generation.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation LLM4DV: Using Large Language Models for Hardware Test Stimuli Generation

Reference 36

Resolution: verified exact; local_arxiv, observed 2026-08-05T18:37:10.273127Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 7f8f999e-5874-400b-9ed5-368010c2d729 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 37

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.420249Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 33030f7e-c940-40ae-97d0-2365abfc288a · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 38

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.403891Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 147cae79-bcf2-4cd8-b1cd-93fefc0637b7 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 39

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.387558Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b44ba6a3-7339-4f0f-b1ba-5373afd3050a · outbound

This paper cites Hu and Z.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Hu and Z

Reference 40

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.370563Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation bf58e558-eb35-469c-918d-9b886bb72357 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 41

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.354804Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation e3da0a33-1520-4d42-9fff-420a470d7f4e · outbound

This paper cites Singh, D.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Singh, D

Reference 42

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.339958Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 97410d79-7758-4a6c-8738-152e42a0df5b · outbound

This paper cites Singh, F.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Singh, F

Reference 43

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T18:37:10.324861Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 34a15f5f-55de-48b0-8fb4-d139ac602b44 · outbound

This paper cites an unresolved cited work.

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Unresolved cited work

Reference 44

Resolution: unresolved; raw_fallback, observed 2026-08-05T18:37:10.309699Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Pith citing papers

Observation 1a73cb91-cd9f-4de1-b21e-8cb9de23b30d · inbound

CWEEP: A Lexical Static Analysis Framework for CWE Early Prevention cites this paper.

CWEEP: A Lexical Static Analysis Framework for CWE Early Prevention Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation

Reference 25

Resolution: unresolved; no resolver link, observed 2026-08-03T03:45:39.313659Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.