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Paper Citation Record · LEDGER

Wavelength-Dependent Electrical Readout of Spin Ensembles in a Thin-Film SiC-on-Insulator Platform

As of 5 August 2026, this Paper Citation Record lists 4 of 4 outbound references and 0 inbound Pith citation observations for arXiv:2511.22485.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2511.22485 v2

Coverage vector

measured 4 of 4 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-05-17T04:49:52.253978Z

measured 4 of 4 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-05T06:32:48.257954+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

4 of 4 outbound references displayed

  • verified exact0
  • verified fuzzy2
  • unresolved0
  • parse uncertain0
  • malformed identifier2
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 917e6341-51ad-4520-a913-f9328ad54ab3 · outbound

This paper cites (12) Fisher, P.; Zappacosta, A.; Fuhrmann, J.; Hay- lock, B.; Gao, W.; Nagy, R.; Jelezko, F.; Cer- nansky, R.Nano Letters2025,25, 11626– 11631.

Wavelength-Dependent Electrical Readout of Spin Ensembles in a Thin-Film SiC-on-Insulator Platform (12) Fisher, P.; Zappacosta, A.; Fuhrmann, J.; Hay- lock, B.; Gao, W.; Nagy, R.; Jelezko, F.; Cer- nansky, R.Nano Letters2025,25, 11626– 11631

Reference 1

Resolution
malformed identifier
doi_truncated, observed 2026-05-17T04:51:31.742766Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.

source=pdf_text observed=2026-05-17T04:49:52.253978Z digest=sha256:1d3190f040e85cbd933bea33ffb0761642f0437608b5897eabbbbe1ed76f69dd

Observation 557f53cd-f363-491f-956b-c49dff52b28f · outbound

This paper cites (19) Xu, J.; Li, C.; Guo, G.Fundamental Research 2021,1, 220–222.

Wavelength-Dependent Electrical Readout of Spin Ensembles in a Thin-Film SiC-on-Insulator Platform (19) Xu, J.; Li, C.; Guo, G.Fundamental Research 2021,1, 220–222

Reference 2

Resolution
verified fuzzy
raw_fallback, observed 2026-05-17T04:51:32.317773Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.

source=pdf_text observed=2026-05-17T04:49:52.253978Z digest=sha256:da4092266216e22ac459f7faab15cfa884ace83f0497dd94fab05eb522a3f097

Observation ab6588ba-32a1-457d-b018-302b4512fbe7 · outbound

This paper cites M.; Braunbeck, G.; Stutzmann, M.; Reinhard, F.; Brandt, M.

Wavelength-Dependent Electrical Readout of Spin Ensembles in a Thin-Film SiC-on-Insulator Platform M.; Braunbeck, G.; Stutzmann, M.; Reinhard, F.; Brandt, M

Reference 3

Resolution
malformed identifier
doi_truncated, observed 2026-05-17T04:51:31.739878Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.

source=pdf_text observed=2026-05-17T04:49:52.253978Z digest=sha256:b41b130b3a1dbf502d8bd64a342cb366161fdfed87e541efee74e050d4857683

Observation 816bf914-9116-48c4-9388-3fdb9a9da29e · outbound

This paper cites (29) Lew, C.

Wavelength-Dependent Electrical Readout of Spin Ensembles in a Thin-Film SiC-on-Insulator Platform (29) Lew, C

Reference 4

Resolution
verified fuzzy
raw_fallback, observed 2026-05-17T04:51:32.320512Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-05T06:32:48.257954+00:00.

source=pdf_text observed=2026-05-17T04:49:52.253978Z digest=sha256:92a65d3996cfbed7d332a8753a980ae1cb9daa1114a59bcf879ca3c3cb7a7aa1

Pith citing papers

No inbound Pith citation observations are available.