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arxiv: 2604.04594 · v1 · submitted 2026-04-06 · ❄️ cond-mat.str-el

Recognition: 2 theorem links

· Lean Theorem

Harnessing the VO2 Phase Transition for Automatic Gain Control in Transimpedance Amplifiers

Authors on Pith no claims yet

Pith reviewed 2026-05-10 19:26 UTC · model grok-4.3

classification ❄️ cond-mat.str-el
keywords VO2insulator-metal transitiontransimpedance amplifierautomatic gain controlphase transitionself-oscillationsresistive switching
0
0 comments X

The pith

Vanadium dioxide devices enable automatic gain control in transimpedance amplifiers through their phase transition.

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The paper establishes that vanadium dioxide's phase transition can be used to create transimpedance amplifiers with built-in automatic gain control. By switching resistance sharply at a threshold, the device prevents output saturation under large input currents and shortens recovery times compared to fixed-resistor designs. Detailed electrical and optical measurements identify conditions for fast, repeatable switching without lingering memory effects. The resulting circuit also produces self-sustained oscillations when biased with constant current, reaching 60 MHz at 2 picojoules per cycle. This points to simpler, more efficient electronics for sensors that encounter fluctuating signals.

Core claim

The central discovery is that a VO2-based transimpedance amplifier exhibits variable gain and automatic gain control by exploiting the insulator-to-metal transition, with the device fabricated by sputtering VO2 and patterning 200 nm gaps. Pump-probe experiments confirm that operation below the critical temperature eliminates memory effects, enabling fast and reliable switching. Under constant DC bias, the circuit produces self-sustained oscillations consuming 2 pJ per spike at frequencies reaching 60 MHz, matching the thermal response time of the material.

What carries the argument

The reversible insulator-metal transition in a thin-film vanadium dioxide switching device that changes resistance abruptly near 67 C in response to temperature or voltage.

If this is right

  • Sensor electronics can avoid saturation and long recovery times when input currents vary widely.
  • High-speed TIAs become more compact and energy-efficient by embedding gain control directly in the material.
  • Self-sustained oscillations open routes to integrated spiking or oscillatory sensor readouts.
  • The approach reduces the need for additional AGC circuitry in advanced sensing applications.

Where Pith is reading between the lines

These are editorial extensions of the paper, not claims the author makes directly.

  • Similar phase-transition materials could replace VO2 for different operating temperatures or speeds.
  • Integration with silicon electronics may require addressing thermal management to maintain the transition point.
  • The low energy per oscillation suggests potential use in low-power neuromorphic or event-driven sensing systems.
  • Field tests under real sensor conditions would reveal if variability affects long-term reliability.

Load-bearing premise

The switching in the VO2 device stays consistent and does not degrade or vary significantly when placed inside an operating amplifier circuit over many cycles or long periods.

What would settle it

Measurement of the TIA output showing loss of automatic gain adjustment or increased switching voltage thresholds after repeated high-current inputs over hours or days.

read the original abstract

Transimpedance amplifiers (TIAs) are essential in sensor electronics, converting input currents into output voltages. Conventional TIAs utilize fixed-gain resistors, which saturate under high input currents and consequently result in undesirable recovery times. To overcome this limitation, volatile resistive switching devices have emerged as a promising alternative, offering intrinsic automatic gain control (AGC). Among these, vanadium dioxide (VO2) devices stand out for their reversible insulator-metal transition (IMT), producing abrupt, energy-efficient resistance changes near the transition temperature (67 C). In this work, a switching device was fabricated by sputtering a VO2 thin film and patterning 200 nm electrode gaps atop it. Before integrating this device into the TIA circuit, its switching dynamics were characterized under electrical pulse excitation. Slightly exceeding the temperature-dependent IMT threshold voltage (Vth) yielded fast and reproducible switching. Complementary pump-probe measurements showed that operating well below TC effectively suppresses short-term memory effects linked to the stochastic nature of the first-order transition. Leveraging these insights, a custom VO2-based TIA was developed, demonstrating variable gain and AGC functionality. Furthermore, applying a constant DC current bias during switching induced self-sustained oscillations (2 pJ per spike) with frequencies up to 60 MHz, consistent with the thermal timescale of the VO2 devices. Overall, these results provide a detailed understanding of VO2 switching dynamics and demonstrate their potential for enabling compact, energy-efficient AGC in high-speed TIAs for advanced sensing applications.

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, simulated authors' rebuttal, and a circularity audit. Tearing a paper down is the easy half of reading it; the pith above is the substance, this is the friction.

Referee Report

3 major / 1 minor

Summary. The manuscript reports fabrication of VO2 thin-film switching devices with 200 nm electrode gaps, electrical pulse characterization showing fast reproducible switching above the temperature-dependent threshold voltage, pump-probe measurements demonstrating suppression of short-term memory effects below the transition temperature, and integration of such a device into a custom transimpedance amplifier (TIA) that exhibits variable gain, automatic gain control (AGC) functionality, and self-sustained oscillations up to 60 MHz (2 pJ per spike) under constant DC current bias.

Significance. If the circuit-level results prove robust and reproducible, the work could enable compact, low-power AGC in high-speed TIAs by exploiting the abrupt, volatile IMT in VO2, addressing saturation and recovery issues in conventional fixed-gain designs for sensor applications. The inclusion of pulse and pump-probe characterization provides useful dynamical insights, though the absence of quantitative circuit metrics currently limits assessment of practical advantage over existing approaches.

major comments (3)
  1. [Abstract] Abstract (TIA demonstration paragraph): the claim that the custom VO2-based TIA demonstrates 'variable gain and AGC functionality' is presented without any supporting quantitative data such as gain versus input-current curves, saturation recovery times, or statistics across multiple devices, which are required to substantiate the central application claim.
  2. [Abstract] Abstract (oscillations sentence): the reported self-sustained oscillations (frequencies up to 60 MHz, 2 pJ per spike) are stated without error bars, device-to-device variability, or endurance data after repeated cycles, leaving open whether the behavior remains stable when the VO2 element is embedded in the TIA feedback loop under realistic bias and thermal conditions.
  3. [Circuit demonstration] The integration and circuit demonstration section: no data or discussion is provided on key load-bearing issues for the AGC claim, including thermal crosstalk from the amplifier circuitry, drift in Vth or oscillation frequency after 10^5–10^6 switching events, or recovery behavior after saturation events, all of which directly affect whether the VO2 IMT remains functional in the integrated device.
minor comments (1)
  1. [Abstract] The abstract would benefit from explicit reference to the number of devices tested and any statistical measures (e.g., standard deviation on frequency or energy values) to strengthen the reproducibility statements.

Simulated Author's Rebuttal

3 responses · 0 unresolved

We thank the referee for the constructive and detailed review of our manuscript. We have addressed each major comment below and indicate the revisions we will make to strengthen the presentation of our results.

read point-by-point responses
  1. Referee: [Abstract] Abstract (TIA demonstration paragraph): the claim that the custom VO2-based TIA demonstrates 'variable gain and AGC functionality' is presented without any supporting quantitative data such as gain versus input-current curves, saturation recovery times, or statistics across multiple devices, which are required to substantiate the central application claim.

    Authors: We agree that the abstract claim would benefit from direct reference to quantitative metrics. The device-level pulse and pump-probe data in the main text provide the physical basis for the variable-gain and AGC behavior, but we acknowledge that explicit circuit-level curves and multi-device statistics are not currently shown. In the revised manuscript we will add gain-versus-input-current curves, saturation recovery times, and statistics from multiple devices to the circuit demonstration section and will update the abstract to cite these additions. revision: yes

  2. Referee: [Abstract] Abstract (oscillations sentence): the reported self-sustained oscillations (frequencies up to 60 MHz, 2 pJ per spike) are stated without error bars, device-to-device variability, or endurance data after repeated cycles, leaving open whether the behavior remains stable when the VO2 element is embedded in the TIA feedback loop under realistic bias and thermal conditions.

    Authors: The oscillation frequencies and energy per spike are taken from our DC-bias measurements. We agree that error bars, variability, and endurance information would improve confidence in the embedded-circuit stability. In revision we will include available statistical measures (standard deviations where measured) and a short discussion of observed device-to-device variability and short-term endurance. Long-term endurance beyond the tested cycle counts will be noted as a limitation with plans for future characterization. revision: partial

  3. Referee: [Circuit demonstration] The integration and circuit demonstration section: no data or discussion is provided on key load-bearing issues for the AGC claim, including thermal crosstalk from the amplifier circuitry, drift in Vth or oscillation frequency after 10^5–10^6 switching events, or recovery behavior after saturation events, all of which directly affect whether the VO2 IMT remains functional in the integrated device.

    Authors: We recognize that thermal crosstalk, long-term drift, and post-saturation recovery are important for assessing practical AGC performance. Our present experiments emphasized short-term dynamics and basic circuit functionality. In the revised manuscript we will expand the circuit section with (i) temperature monitoring data to address thermal crosstalk, (ii) observed Vth and frequency stability during the performed cycles, and (iii) recovery characteristics drawn from the pump-probe results. For endurance at 10^5–10^6 events we will state the current experimental limit and its implications. revision: yes

Circularity Check

0 steps flagged

No circularity: experimental demonstration with no derivations or fitted predictions

full rationale

The paper is an experimental work describing VO2 device fabrication (200 nm gaps), pulse characterization of IMT switching, pump-probe measurements to suppress memory effects, and integration into a custom TIA circuit to demonstrate variable gain, AGC, and DC-bias oscillations up to 60 MHz. No mathematical derivations, equations, or predictions are present that could reduce to inputs by construction. All claims rest on direct physical measurements and observed circuit behavior rather than any self-referential fitting, self-citation chains, or ansatz smuggling. The work is self-contained against external benchmarks of device performance.

Axiom & Free-Parameter Ledger

0 free parameters · 1 axioms · 0 invented entities

The work relies on established properties of VO2 and standard microfabrication techniques; no new free parameters, ad-hoc axioms, or invented entities are introduced beyond the fabricated device itself.

axioms (1)
  • domain assumption VO2 undergoes a reversible insulator-metal transition near 67 C that produces abrupt resistance change.
    Invoked as the physical basis for the switching behavior and AGC function throughout the abstract.

pith-pipeline@v0.9.0 · 5581 in / 1314 out tokens · 52999 ms · 2026-05-10T19:26:41.269564+00:00 · methodology

discussion (0)

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Works this paper leans on

54 extracted references · 53 canonical work pages

  1. [1]

    The Transimpedance Amplifier [A Circuit for All Seasons],

    B. Razavi, “The Transimpedance Amplifier [A Circuit for All Seasons],” IEEE Solid-State Circuits Mag., vol. 11, no. 1, pp. 10–97, 2019, doi: 10.1109/MSSC.2018.2881860

  2. [2]

    Säckinger, Analysis and Design of Transimpedance Amplifiers for Optical Receivers

    E. Säckinger, Analysis and Design of Transimpedance Amplifiers for Optical Receivers. Wiley, 2017

  3. [3]

    Low-Noise Broadband CMOS TIA Based on Multi-Stage Stagger-Tuned Amplifier for High-Speed High- Sensitivity Optical Communication,

    D. Li et al., “Low-Noise Broadband CMOS TIA Based on Multi-Stage Stagger-Tuned Amplifier for High-Speed High- Sensitivity Optical Communication,” IEEE Trans. Circuits Syst. Regul. Pap., vol. 66, no. 10, pp. 3676–3689, Oct. 2019, doi: 10.1109/TCSI.2019.2916150

  4. [4]

    A Multi-Stage RC Compensation Technique for Decoupling the Transimpedance and BW: Creating High Speed and Low Noise TIA Designs,

    M. B. Babar and G. W. Roberts, “A Multi-Stage RC Compensation Technique for Decoupling the Transimpedance and BW: Creating High Speed and Low Noise TIA Designs,” IEEE Trans. Circuits Syst. Regul. Pap., vol. 72, no. 8, pp. 3847–3860, Aug. 2025, doi: 10.1109/TCSI.2025.3556802

  5. [5]

    A high gain wide dynamic range transimpedance amplifier for optical receivers,

    and, and, and and and, “A high gain wide dynamic range transimpedance amplifier for optical receivers,” J. Semicond., vol. 35, no. 1, p. 015001, Jan. 2014, doi: 10.1088/1674-4926/35/1/015001

  6. [6]

    A Physics Based Unified Circuit Model for Single Photon and Analog Detector,

    M. A. R. Miah, Y. Jiang, and Y.-H. Lo, “A Physics Based Unified Circuit Model for Single Photon and Analog Detector,” IEEE Access, vol. 9, pp. 129571–129581, 2021, doi: 10.1109/ACCESS.2021.3113301

  7. [7]

    Design, Performance and Challenges of Integrated and Discrete Transimpedance Amplifiers for Nanopore Signal Readout: A Review,

    K. Ashoka Deepthi, M. Varma, and A. Polley, “Design, Performance and Challenges of Integrated and Discrete Transimpedance Amplifiers for Nanopore Signal Readout: A Review,” IEEE Sens. J., pp. 1–1, 2025, doi: 10.1109/JSEN.2025.3590595. 11

  8. [8]

    Analysis and Design of Ultra-Large Dynamic Range CMOS Transimpedance Amplifier With Automatically-Controlled Multi-Current-Bleeding Paths,

    X. Bi, Z. Gu, and Q. Xu, “Analysis and Design of Ultra-Large Dynamic Range CMOS Transimpedance Amplifier With Automatically-Controlled Multi-Current-Bleeding Paths,” IEEE Trans. Circuits Syst. Regul. Pap., vol. 66, no. 9, pp. 3266–3278, Sep. 2019, doi: 10.1109/TCSI.2019.2924965

  9. [9]

    A 10Gb/s APD-based linear burst-mode receiver with 31dB dynamic range for reach-extended PON systems,

    X. Yin et al., “A 10Gb/s APD-based linear burst-mode receiver with 31dB dynamic range for reach-extended PON systems,” Opt. Express, vol. 20, no. 26, pp. B462–B469, Dec. 2012, doi: 10.1364/OE.20.00B462

  10. [10]

    Quantum Sensitive, Record Dynamic Range Terahertz Tunnel Field-Effect Transistor Detectors Exploiting Multilayer Graphene/hBN/Bilayer Graphene/hBN Heterostructures,

    L. Viti, L. Shi, K. Watanabe, T. Taniguchi, and M. S. Vitiello, “Quantum Sensitive, Record Dynamic Range Terahertz Tunnel Field-Effect Transistor Detectors Exploiting Multilayer Graphene/hBN/Bilayer Graphene/hBN Heterostructures,” Nano Lett., vol. 25, no. 15, pp. 6005–6012, Apr. 2025, doi: 10.1021/acs.nanolett.4c04934

  11. [11]

    High dynamic range HgCdTe APD detector dedicated to LiDAR applications: design and test results,

    E. de Borniol, J. Abergel, G. Badano, J.-A. Nicolas, J.-P. Rostaing, and J. Rothman, “High dynamic range HgCdTe APD detector dedicated to LiDAR applications: design and test results,” in International Conference on Space Optics — ICSO 2022, SPIE, Jul. 2023, pp. 984–997. doi: 10.1117/12.2689980

  12. [12]

    Ultrahigh-speed point scanning two- photon microscopy using high dynamic range silicon photomultipliers,

    V. D. Ching-Roa, E. M. Olson, S. F. Ibrahim, R. Torres, and M. G. Giacomelli, “Ultrahigh-speed point scanning two- photon microscopy using high dynamic range silicon photomultipliers,” Sci. Rep., vol. 11, no. 1, p. 5248, Mar. 2021, doi: 10.1038/s41598-021-84522-0

  13. [13]

    Enhancing dynamic range of High-Sensitivity Quasi-Distributed accelerometer array based on UWFBG by employing TDU algorithm,

    W. Huang, J. Tang, P. Cheng, H. Wang, C. Cheng, and M. Yang, “Enhancing dynamic range of High-Sensitivity Quasi-Distributed accelerometer array based on UWFBG by employing TDU algorithm,” Opt. Laser Technol., vol. 180, p. 111475, Jan. 2025, doi: 10.1016/j.optlastec.2024.111475

  14. [14]

    A CMOS transimpedance amplifier with high gain and wide dynamic range for optical fiber sensing system,

    L. Liu, J. Zou, N. Ma, Z. Zhu, and Y. Yang, “A CMOS transimpedance amplifier with high gain and wide dynamic range for optical fiber sensing system,” Optik, vol. 126, no. 15, pp. 1389–1393, Aug. 2015, doi: 10.1016/j.ijleo.2015.04.021

  15. [15]

    130dB-DR Transimpedance Amplifier with Monotonic Logarithmic Compression and High-Current Monitor,

    D. Micusik and H. Zimmermann, “130dB-DR Transimpedance Amplifier with Monotonic Logarithmic Compression and High-Current Monitor,” in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, Feb. 2008, pp. 78–597. doi: 10.1109/ISSCC.2008.4523065

  16. [16]

    80 dB tuning range transimpedance amplifier exploiting the Switched-Resistor approach,

    F. Centurelli, A. Fava, G. Scotti, and A. Trifiletti, “80 dB tuning range transimpedance amplifier exploiting the Switched-Resistor approach,” AEU - Int. J. Electron. Commun., vol. 149, p. 154196, May 2022, doi: 10.1016/j.aeue.2022.154196

  17. [17]

    On the Noise Optimum of FET Broadband Transimpedance Amplifiers,

    E. Sackinger, “On the Noise Optimum of FET Broadband Transimpedance Amplifiers,” IEEE Trans. Circuits Syst. Regul. Pap., vol. 59, no. 12, pp. 2881–2889, Dec. 2012, doi: 10.1109/TCSI.2012.2206452

  18. [18]

    An auto-gain control transimpedance amplifier with low noise and wide input dynamic range for 10-Gb/s optical communication systems,

    H. Ikeda, T. Ohshima, M. Tsunotani, T. Ichioka, and T. Kimura, “An auto-gain control transimpedance amplifier with low noise and wide input dynamic range for 10-Gb/s optical communication systems,” IEEE J. Solid-State Circuits, vol. 36, no. 9, pp. 1303–1308, Sep. 2001, doi: 10.1109/4.944655

  19. [19]

    A CMOS Optoelectronic Transimpedance Amplifier Using Concurrent Automatic Gain Control for LiDAR Sensors,

    Y. Chon, S. Choi, and S.-M. Park, “A CMOS Optoelectronic Transimpedance Amplifier Using Concurrent Automatic Gain Control for LiDAR Sensors,” Photonics, vol. 11, no. 10, p. 974, Oct. 2024, doi: 10.3390/photonics11100974

  20. [20]

    Advances of RRAM Devices: Resistive Switching Mechanisms, Materials and Bionic Synaptic Application,

    Z. Shen et al., “Advances of RRAM Devices: Resistive Switching Mechanisms, Materials and Bionic Synaptic Application,” Nanomaterials, vol. 10, no. 8, p. 1437, Aug. 2020, doi: 10.3390/nano10081437

  21. [21]

    Transimpedance Amplifier with Automatic Gain Control Based on Memristors for Optical Signal Acquisition,

    S. Hodisan and S. Kvatinsky, “Transimpedance Amplifier with Automatic Gain Control Based on Memristors for Optical Signal Acquisition,” May 03, 2024, arXiv: arXiv:2405.02169. doi: 10.48550/arXiv.2405.02169

  22. [22]

    Metal-insulator transitions,

    M. Imada, A. Fujimori, and Y. Tokura, “Metal-insulator transitions,” Rev. Mod. Phys., vol. 70, no. 4, p. 1039, Oct. 1998, doi: 10.1103/RevModPhys.70.1039

  23. [23]

    Integrated Hybrid VO2–Silicon Optical Memory,

    Y. Jung, H. Han, A. Sharma, J. Jeong, S. S. P. Parkin, and J. K. S. Poon, “Integrated Hybrid VO2–Silicon Optical Memory,” ACS Photonics, vol. 9, no. 1, pp. 217–223, Jan. 2022, doi: 10.1021/acsphotonics.1c01410

  24. [24]

    Stochasticity in the synchronization of strongly coupled spiking oscillators,

    E. Qiu et al., “Stochasticity in the synchronization of strongly coupled spiking oscillators,” Appl. Phys. Lett., vol. 122, no. 9, p. 094105, Feb. 2023, doi: 10.1063/5.0129205

  25. [25]

    Reconfigurable Cascaded Thermal Neuristors for Neuromorphic Computing,

    E. Qiu, Y. Zhang, M. D. Ventra, and I. K. Schuller, “Reconfigurable Cascaded Thermal Neuristors for Neuromorphic Computing,” Adv. Mater., vol. 36, no. 6, p. 2306818, Feb. 2024, doi: 10.1002/adma.202306818

  26. [27]

    A CMOS-compatible oscillation-based VO2 Ising machine solver,

    O. Maher et al., “A CMOS-compatible oscillation-based VO2 Ising machine solver,” Nat. Commun., vol. 15, no. 1, p. 3334, Apr. 2024, doi: 10.1038/s41467-024-47642-5

  27. [28]

    Electrical oscillations induced by the metal-insulator transition in VO2,

    H.-T. Kim et al., “Electrical oscillations induced by the metal-insulator transition in VO2,” J. Appl. Phys., vol. 107, no. 2, p. 023702, Jan. 2010, doi: 10.1063/1.3275575

  28. [29]

    Highly reproducible and CMOS-compatible VO2-based oscillators for brain-inspired computing,

    O. Maher et al., “Highly reproducible and CMOS-compatible VO2-based oscillators for brain-inspired computing,” Sci. Rep., vol. 14, no. 1, p. 11600, May 2024, doi: 10.1038/s41598-024-61294-x

  29. [30]

    A caloritronics-based Mott neuristor,

    J. del Valle, P. Salev, Y. Kalcheim, and I. K. Schuller, “A caloritronics-based Mott neuristor,” Sci. Rep., vol. 10, no. 1, p. 4292, Mar. 2020, doi: 10.1038/s41598-020-61176-y

  30. [31]

    Quantum imaging of the reconfigurable VO2 synaptic electronics for neuromorphic computing,

    C. Feng et al., “Quantum imaging of the reconfigurable VO2 synaptic electronics for neuromorphic computing,” Sci. Adv., vol. 9, no. 40, p. eadg9376, Oct. 2023, doi: 10.1126/sciadv.adg9376

  31. [32]

    Pattern formation dynamics in a Memristor Cellular Nonlinear Network structure with a numerically stable VO2 memristor model,

    A. S. Demirkol, A. Ascoli, I. Messaris, and R. Tetzlaff, “Pattern formation dynamics in a Memristor Cellular Nonlinear Network structure with a numerically stable VO2 memristor model,” Jpn. J. Appl. Phys., vol. 61, no. SM, p. SM0807, Aug. 2022, doi: 10.35848/1347-4065/ac8489

  32. [33]

    Measurement of a solid-state triple point at the metal–insulator transition in VO2,

    J. H. Park et al., “Measurement of a solid-state triple point at the metal–insulator transition in VO2,” Nature, vol. 500, no. 7463, pp. 431–434, Aug. 2013, doi: 10.1038/nature12425

  33. [34]

    Oxides Which Show a Metal-to-Insulator Transition at the Neel Temperature,

    F. J. Morin, “Oxides Which Show a Metal-to-Insulator Transition at the Neel Temperature,” Phys. Rev. Lett., vol. 3, no. 1, pp. 34–36, Jul. 1959, doi: 10.1103/PhysRevLett.3.34

  34. [35]

    Note on a Phase Transition in VO2,

    S. Westman, I. Lindqvist, B. Sparrman, G. B. Nielsen, H. Nord, and A. Jart, “Note on a Phase Transition in VO2,” Acta Chem. Scand. 1989, vol. 15, Dec. 1960, doi: 10.3891/acta.chem.scand.15-0217. 12

  35. [36]

    Energy-efficient Mott activation neuron for full-hardware implementation of neural networks,

    S. Oh et al., “Energy-efficient Mott activation neuron for full-hardware implementation of neural networks,” Nat. Nanotechnol., vol. 16, no. 6, pp. 680–687, Jun. 2021, doi: 10.1038/s41565-021-00874-8

  36. [37]

    Electro-Thermal Characterization of Dynamical VO2 Memristors via Local Activity Modeling,

    T. D. Brown, S. M. Bohaichuk, M. Islam, S. Kumar, E. Pop, and R. S. Williams, “Electro-Thermal Characterization of Dynamical VO2 Memristors via Local Activity Modeling,” Adv. Mater., vol. 35, no. 37, p. 2205451, 2023, doi: 10.1002/adma.202205451

  37. [38]

    Resistive switching studies in VO2 thin films,

    A. Rana, C. Li, G. Koster, and H. Hilgenkamp, “Resistive switching studies in VO2 thin films,” Sci. Rep., vol. 10, no. 1, p. 3293, Feb. 2020, doi: 10.1038/s41598-020-60373-z

  38. [39]

    Nanoscale imaging and control of resistance switching in VO2 at room temperature,

    J. Kim, C. Ko, A. Frenzel, S. Ramanathan, and J. E. Hoffman, “Nanoscale imaging and control of resistance switching in VO2 at room temperature,” Appl. Phys. Lett., vol. 96, no. 21, p. 213106, May 2010, doi: 10.1063/1.3435466

  39. [40]

    Strain-Induced Self Organization of Metal−Insulator Domains in Single-Crystalline VO2 Nanobeams,

    J. Wu, Q. Gu, B. S. Guiton, N. P. de Leon, L. Ouyang, and H. Park, “Strain-Induced Self Organization of Metal−Insulator Domains in Single-Crystalline VO2 Nanobeams,” Nano Lett., vol. 6, no. 10, pp. 2313–2317, Oct. 2006, doi: 10.1021/nl061831r

  40. [41]

    Inherent stochasticity during insulator–metal transition in VO2,

    S. Cheng et al., “Inherent stochasticity during insulator–metal transition in VO2,” Proc. Natl. Acad. Sci., vol. 118, no. 37, p. e2105895118, Sep. 2021, doi: 10.1073/pnas.2105895118

  41. [42]

    Nanoscale Imaging and Control of Volatile and Non-Volatile Resistive Switching in VO2,

    A. G. Shabalin et al., “Nanoscale Imaging and Control of Volatile and Non-Volatile Resistive Switching in VO2,” Small, vol. 16, no. 50, p. 2005439, 2020, doi: 10.1002/smll.202005439

  42. [43]

    Switching mechanism in two-terminal vanadium dioxide devices,

    I. P. Radu et al., “Switching mechanism in two-terminal vanadium dioxide devices,” Nanotechnology, vol. 26, no. 16, p. 165202, Mar. 2015, doi: 10.1088/0957-4484/26/16/165202

  43. [44]

    Voltage-Triggered Ultrafast Phase Transition in Vanadium Dioxide Switches,

    Y. Zhou, X. Chen, C. Ko, Z. Yang, C. Mouli, and S. Ramanathan, “Voltage-Triggered Ultrafast Phase Transition in Vanadium Dioxide Switches,” IEEE Electron Device Lett., vol. 34, no. 2, pp. 220–222, Feb. 2013, doi: 10.1109/LED.2012.2229457

  44. [45]

    Erratum to ‘Stability and dewetting kinetics of thin gold films on Ti, TiO and ZnO adhesion layers’ [Acta Mater. 61 (2013) 7841–7848],

    B. T. Schaefer, J. Cheung, J. F. Ihlefeld, J. L. Jones, and V. Nagarajan, “Erratum to ‘Stability and dewetting kinetics of thin gold films on Ti, TiO and ZnO adhesion layers’ [Acta Mater. 61 (2013) 7841–7848],” Acta Mater., vol. 70, pp. 316–317, May 2014, doi: 10.1016/j.actamat.2013.12.024

  45. [46]

    Chemically Homogeneous Complex Oxide Thin Films Via Improved Substrate Metallization,

    C. T. Shelton et al., “Chemically Homogeneous Complex Oxide Thin Films Via Improved Substrate Metallization,” Adv. Funct. Mater., vol. 22, no. 11, pp. 2295–2302, 2012, doi: 10.1002/adfm.201103077

  46. [47]

    Current-limiting amplifier for high speed measurement of resistive switching data,

    T. Hennen et al., “Current-limiting amplifier for high speed measurement of resistive switching data,” Rev. Sci. Instrum., vol. 92, no. 5, p. 054701, May 2021, doi: 10.1063/5.0047571

  47. [48]

    Subthreshold firing in Mott nanodevices,

    J. del Valle et al., “Subthreshold firing in Mott nanodevices,” Nature, vol. 569, no. 7756, pp. 388–392, May 2019, doi: 10.1038/s41586-019-1159-6

  48. [49]

    Spatiotemporal characterization of the field-induced insulator-to-metal transition,

    J. del Valle et al., “Spatiotemporal characterization of the field-induced insulator-to-metal transition,” Science, vol. 373, no. 6557, pp. 907–911, Aug. 2021, doi: 10.1126/science.abd9088

  49. [50]

    Computational elements based on coupled VO2 oscillators via tunable thermal triggering,

    G. Li, Z. Wang, Y. Chen, J.-C. Jeon, and S. S. P. Parkin, “Computational elements based on coupled VO2 oscillators via tunable thermal triggering,” Nat. Commun., vol. 15, no. 1, p. 5820, Jul. 2024, doi: 10.1038/s41467-024-49925-3

  50. [51]

    Avalanche breakdown and self-stabilization effects in electrically driven transition of carbon nanotube covered VO2 film,

    Y. Chen et al., “Avalanche breakdown and self-stabilization effects in electrically driven transition of carbon nanotube covered VO2 film,” J. Phys. Appl. Phys., vol. 50, no. 25, p. 255101, May 2017, doi: 10.1088/1361-6463/aa7161

  51. [52]

    Fast Spiking of a Mott VO2–Carbon Nanotube Composite Device,

    S. M. Bohaichuk et al., “Fast Spiking of a Mott VO2–Carbon Nanotube Composite Device,” Nano Lett., vol. 19, no. 10, pp. 6751–6755, Oct. 2019, doi: 10.1021/acs.nanolett.9b01554

  52. [53]

    Ultra low power coupled oscillator arrays for computer vision applications,

    N. Shukla, W.-Y. Tsai, M. Jerry, M. Barth, V. Narayanan, and S. Datta, “Ultra low power coupled oscillator arrays for computer vision applications,” in 2016 IEEE Symposium on VLSI Technology, Jun. 2016, pp. 1–2. doi: 10.1109/VLSIT.2016.7573439

  53. [54]

    A 0.11–0.38 pJ/cycle Differential Ring Oscillator in 65 nm CMOS for Robust Neurocomputing,

    X. Zhang, J. Acharya, and A. Basu, “A 0.11–0.38 pJ/cycle Differential Ring Oscillator in 65 nm CMOS for Robust Neurocomputing,” IEEE Trans. Circuits Syst. Regul. Pap., vol. 68, no. 2, pp. 617–630, Feb. 2021, doi: 10.1109/TCSI.2020.3036454

  54. [55]

    A Low-Power, 65 nm 24.6-to-30.1 GHz Trusted LC Voltage-Controlled Oscillator Achieving 191.7 dBc/Hz FoM at 1 MHz,

    A. Kurtoglu, A. H. M. Shirazi, S. Mirabbasi, and H. Miri Lavasani, “A Low-Power, 65 nm 24.6-to-30.1 GHz Trusted LC Voltage-Controlled Oscillator Achieving 191.7 dBc/Hz FoM at 1 MHz,” J. Low Power Electron. Appl., vol. 14, no. 1, p. 10, Mar. 2024, doi: 10.3390/jlpea14010010