Integrity report for Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2604.22155

0Critical

1Advisory

2Detectors run

2026-05-21Last checked

Paper page arXiv integrity.json

Detector runs

ai_meta_artifact completed v1.0.0 · findings 0 · 2026-05-21 11:35:52.715989+00:00

doi_compliance completed v1.0.0 · findings 1 · 2026-05-20 00:13:58.044920+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/2604.22155/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.