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arxiv: 2604.27629 · 3 revisions

WaferSAGE: Large Language Model-Powered Wafer Defect Analysis via Synthetic Data Generation and Rubric-Guided Reinforcement Learning

1. 2026-05-12 UNVERDICTED LOW v0.9.0 novelty 6.0
   38484 ms 5508 in 1296 out 2026-05-12T02:47:22.906715+00:00
2. 2026-05-08 UNVERDICTED LOW v0.9.0 novelty 4.0
   99819 ms 5504 in 1656 out 2026-05-08T02:57:08.887727+00:00
3. 2026-05-07 UNVERDICTED LOW v0.9.0 novelty 5.0
   52345 ms 5504 in 1523 out 2026-05-07T07:01:07.869301+00:00