Paper Citation Record · LEDGER

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors

As of 10 August 2026, this Paper Citation Record lists 47 of 47 outbound references and 3 inbound Pith citation observations for arXiv:2605.00544.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2605.00544 v1

Coverage vector

measured 47 of 47 reference resolution

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measured 50 of 50 standing notices

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measured 3 of 3 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-07-04T00:48:46.936506Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: pith, observed 2026-07-04T00:49:17.278120Z

Reference resolution

47 of 47 outbound references displayed

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External citation measurements

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Outbound references

Observation bad4c666-60ed-4e4d-8223-0977351fa571 · outbound

This paper cites The detailed process flow for this work is given in Supplementary information Figure S1.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors The detailed process flow for this work is given in Supplementary information Figure S1

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.923933Z

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Observation 6a74a7ee-215c-4b5b-8251-af1f9d2fa0ba · outbound

This paper cites elbow method.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors elbow method

Reference 2

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.838735Z

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Observation 0bc69382-bb1b-43d7-ae33-d906889ec41d · outbound

This paper cites training.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors training

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.834681Z

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Observation 7874d5e8-878b-485d-8347-1203d652e37f · outbound

This paper cites training.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors training

Reference 4

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Observation 617d7ee7-8cdf-4b4b-9f21-d7a0c5c9e681 · outbound

This paper cites Virtual Metrology.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Virtual Metrology

Reference 5

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.849581Z

Source-reported events for the cited work

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Observation 8e6c5aa0-29d3-4d47-aee2-b7f8da427f57 · outbound

This paper cites Senoner, T.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Senoner, T

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.853080Z

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Observation f09e91e6-5ee6-43dc-ad8f-28e521246588 · outbound

This paper cites Ghahramani, Y.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Ghahramani, Y

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.914449Z

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Observation ca063fbf-c756-4b12-a07a-5f79e182f060 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 8

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.856706Z

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Observation 165d474e-fdd5-4526-8b44-ba7c6ac047c4 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 9

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Observation 1267c1f8-d439-4c7e-8c2c-06081dfb7530 · outbound

This paper cites Memory Is All You Need: An Overview of Compute-in-Memory Architectures for Accelerating Large Language Model Inference.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Memory Is All You Need: An Overview of Compute-in-Memory Architectures for Accelerating Large Language Model Inference

Reference 10

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Observation 5cd24de9-cd2e-4a0f-a03c-cca22d0b790b · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 11

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.871875Z

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Observation 9b2c2557-6aff-4a2f-a9da-9cd2ea6e70db · outbound

This paper cites Bhardwaj, et al., Adv.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Bhardwaj, et al., Adv

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.804711Z

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Observation 6bed1516-6fa9-4862-b4e8-c330e216848f · outbound

This paper cites Majumdar, Adv.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Majumdar, Adv

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.813159Z

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Observation c6825132-261e-4573-9cb1-03e57390e012 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 14

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.830743Z

Source-reported events for the cited work

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Observation e479654f-23a2-43eb-8b5c-7424d1e4be1f · outbound

This paper cites Bhardwaj, E.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Bhardwaj, E

Reference 15

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.799407Z

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Observation 006fc6f6-ffb2-4475-8a69-559f7dabbeee · outbound

This paper cites Majumdar, Neuromorphic Comput.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Majumdar, Neuromorphic Comput

Reference 16

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.792306Z

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Observation cb137bfa-3404-45e8-a6ed-a6aa6871c286 · outbound

This paper cites Athle, M.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Athle, M

Reference 17

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.841961Z

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Observation 1694165b-a7ec-4285-bb37-2f627658b7e1 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 18

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.797406Z

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Observation ec1267f2-7434-4ef7-82bd-d720999cc096 · outbound

This paper cites Müller, T.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Müller, T

Reference 19

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.816901Z

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Observation bdadbc4b-09b3-4983-8827-0586ada55d6e · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 20

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.879076Z

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Observation 0f182bfe-ca13-460a-ac81-ba13d7af3321 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 21

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.917985Z

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Observation 6270db4a-12ea-4765-891f-5c70f583140d · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 22

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.920557Z

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Observation 4ed81880-3c22-460e-bd9a-48d7d43785f7 · outbound

This paper cites Alrifai, E.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Alrifai, E

Reference 23

Resolution: verified exact; doi, observed 2026-05-09T19:05:10.896513Z

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Observation 6f323a0e-cc48-471a-b6aa-185035920ec2 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 24

Resolution: verified exact; doi, observed 2026-05-09T19:05:10.894778Z

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Observation bda9d794-83b6-41ea-9512-6a9e08f28bc4 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 25

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.899896Z

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Observation 37ab2a4d-4f00-4262-9ae7-44e58398b9c3 · outbound

This paper cites Record High Polarization at 2V and Imprint-free operation in Superlattice HfO2-ZrO2 by Proper Tuning of Ferro and Antiferroelectricity.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Record High Polarization at 2V and Imprint-free operation in Superlattice HfO2-ZrO2 by Proper Tuning of Ferro and Antiferroelectricity

Reference 26

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Observation f63ce785-1224-4bdb-89b8-c4da019a69b3 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 27

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.882191Z

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Observation a6e93a38-0d7c-4364-925d-7a1ae5e769e0 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 28

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.893039Z

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Observation 11611d94-eb6a-4800-b467-af0bef9d8f40 · outbound

This paper cites Towards Improved Polarization Uniformity in Ferroelectric Hf$_{0.5}$Zr$_{0.5}$O$_2$ Devices within Back End of Line Thermal Budget for Memory and Neuromorphic Applications.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Towards Improved Polarization Uniformity in Ferroelectric Hf$_{0.5}$Zr$_{0.5}$O$_2$ Devices within Back End of Line Thermal Budget for Memory and Neuromorphic Applications

Reference 29

Resolution: verified exact; arxiv_id, observed 2026-05-11T16:06:16.578666Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 35727335-3974-47ed-b804-a6c03edfdc70 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 30

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.903457Z

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No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation b4a6b612-35a5-4871-8a83-4441d03cb85c · outbound

This paper cites Paasio, et al., Microsyst.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Paasio, et al., Microsyst

Reference 31

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.910462Z

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No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation dbd5d0e8-603c-4867-9c73-626d9d2b7cb2 · outbound

This paper cites Hastie, R.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Hastie, R

Reference 32

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.875221Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 36bff39b-1d20-48b1-aa60-1fd668337b22 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 33

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.867744Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 3cce0325-0642-4313-b3ae-43bb6a010c31 · outbound

This paper cites Saqlain, Q.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Saqlain, Q

Reference 34

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.896595Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 58e3b129-df26-4a26-b381-9c8ec97f8b28 · outbound

This paper cites Theodosiou, et al., Procedia Comput.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Theodosiou, et al., Procedia Comput

Reference 35

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.801244Z

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No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 2cf6b378-2adf-4044-a396-a2b2efe01b7b · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 36

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.821214Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation eff82948-c809-45e7-bb31-653ecb9cd85f · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 37

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.820412Z

Source-reported events for the cited work

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Observation 67c6848e-6b54-454e-b0a8-d65415ee196f · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 38

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.885642Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 2ef6f3f9-1af0-4e28-9c50-f3676dbbaab9 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 39

Resolution: verified exact; doi, observed 2026-05-09T19:05:10.901123Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 90f99713-2dea-447b-9d59-58839f5dc52a · outbound

This paper cites A ConvNet for the 2020s.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors A ConvNet for the 2020s

Reference 40

Resolution: metadata mismatch; arxiv_id, observed 2026-05-09T19:05:10.904181Z

Source-reported events for the cited work

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Observation d0863cd8-6377-4c9e-a420-530b6faca827 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 41

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.828100Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 2024e3cc-7107-45cd-ad42-6ba0a5c86c7d · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 42

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.807376Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation cad256c1-9882-4268-94ff-3f8d1c25146b · outbound

This paper cites Koduru, I.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Koduru, I

Reference 43

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.802886Z

Source-reported events for the cited work

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Observation 3e213207-b5f4-48ea-baf6-a7855c6eabe2 · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 44

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.823591Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation a9fa08db-14b9-47a3-93c6-c3d3047d994b · outbound

This paper cites an unresolved cited work.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Unresolved cited work

Reference 45

Resolution: unresolved; raw_fallback, observed 2026-05-25T22:47:13.845360Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 9155918f-c5d4-4a25-b5e7-1340de26765b · outbound

This paper cites Mikolajick, S.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Mikolajick, S

Reference 46

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.860634Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 39011529-0957-49e4-a57a-72ca979542ff · outbound

This paper cites Srivari, E.

An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors Srivari, E

Reference 47

Resolution: verified fuzzy; raw_fallback, observed 2026-05-25T22:47:13.907083Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Pith citing papers

Observation 9577ef91-e580-4994-8ae1-9e539b9fe811 · inbound

FCDC: Nonvolatile Charge-Domain Attention with HZO Ferroelectric Capacitors cites this paper.

FCDC: Nonvolatile Charge-Domain Attention with HZO Ferroelectric Capacitors An Unsupervised Machine Learning-based Framework for Wafer Scale Variability Analysis and Performance Prediction of Ferroelectric Hf0.5Zr0.5O2 Thin Film Capacitors

Reference 1

Resolution: verified exact; local_arxiv, observed 2026-06-29T09:53:17.531890Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation 46f02ced-1097-4feb-bc93-ca50701857bc · inbound

FCDC: Nonvolatile Charge-Domain Attention with HZO Ferroelectric Capacitors cites this paper.

Reference 1

Resolution: verified exact; local_arxiv, observed 2026-06-30T11:34:38.194360Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

Observation c7ec470d-3e98-4eb3-8294-d05990b95db2 · inbound

FCDC: Nonvolatile Charge-Domain Attention with HZO Ferroelectric Capacitors cites this paper.

Reference 1

Resolution: verified exact; local_arxiv, observed 2026-07-04T00:49:17.298370Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.