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Review history

arxiv: 2605.12143 · 2 revisions

Understanding oxide-thickness-dependent variability in dense Si-MOS quantum dot arrays

1. 2026-05-14 UNVERDICTED LOW v0.9.0 novelty 5.0
   42842 ms 5525 in 1171 out 2026-05-14T20:47:56.137183+00:00
2. 2026-05-13 UNVERDICTED LOW v0.9.0 novelty 5.0
   153182 ms 5525 in 1271 out 2026-05-13T04:14:38.272396+00:00