Pith. sign in

Paper Citation Record · LEDGER

Defect Control via Cu Enrichment Enhances Multifunctional Properties in the Polar Semiconductor Cu1+xMn1-ySiTe3

As of 6 August 2026, this Paper Citation Record lists 2 of 2 outbound references and 0 inbound Pith citation observations for arXiv:2605.18584.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2605.18584 v1

Coverage vector

measured 2 of 2 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-05-20T09:05:18.522467Z

measured 2 of 2 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-06T06:34:29.942622+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

2 of 2 outbound references displayed

  • verified exact0
  • verified fuzzy2
  • unresolved0
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 69477c5c-9add-4dfc-bb83-762b462cec3f · outbound

This paper cites De et al., Sci.

Defect Control via Cu Enrichment Enhances Multifunctional Properties in the Polar Semiconductor Cu1+xMn1-ySiTe3 De et al., Sci

Reference 1

Resolution
verified fuzzy
raw_fallback, observed 2026-05-20T09:13:25.188822Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

source=pdf_text observed=2026-05-20T09:05:18.522467Z digest=sha256:fc804afd83ae3d045fd827c41384329c5c23a06c3ddba3731e6250ed307a67de

Observation c6c9c006-88b5-487b-8c90-57e9e2a5d108 · outbound

This paper cites Ghosh, S.

Defect Control via Cu Enrichment Enhances Multifunctional Properties in the Polar Semiconductor Cu1+xMn1-ySiTe3 Ghosh, S

Reference 2

Resolution
verified fuzzy
raw_fallback, observed 2026-05-20T09:13:25.186809Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

source=pdf_text observed=2026-05-20T09:05:18.522467Z digest=sha256:16b7186838d8a5862306af07930ccfe97ee41bf65420fbe0636e8deef511497b

Pith citing papers

No inbound Pith citation observations are available.