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Paper Citation Record · LEDGER

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

As of 14 August 2026, this Paper Citation Record lists 50 of 50 outbound references and 2 inbound Pith citation observations for arXiv:2606.22366.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2606.22366 v2

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measured 50 of 50 reference resolution

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Source: paper_references, paper_reference_links, observed 2026-07-11T11:50:26.030339Z

measured 52 of 52 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-14T06:32:32.682623+00:00

measured 2 of 2 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-07-11T11:50:26.030339Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: pith, observed 2026-07-10T12:15:01.137692Z

Reference resolution

50 of 50 outbound references displayed

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  • verified fuzzy0
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Outbound references

Observation c58acf2f-a132-42ee-b9fd-bbd002ddde69 · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 1

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Observation b0c8069e-3649-4dec-90cb-4449b190739b · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 2

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Observation 9019bec1-2f69-4471-9ff0-823d99123e25 · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 3

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Observation 6973a8b2-a70b-46ff-8b6d-14a5df134afe · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 4

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Observation e5b1650c-7959-485b-9548-5fabf7d2cdad · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 5

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:84b80734763ea346822c3f3a0a8bdaf03622b51f46e834253c0eae89ba2b6b5c

Observation 036d4915-234a-4033-a173-e22034cc5b3f · outbound

This paper cites Alignment-Free Nanometric Optical Metrology Enabled by Structured Light.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

Reference 6

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No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-07-11T11:50:26.030339Z digest=sha256:45de357af4c5c9e5f17ce6bad4a2bdf4f275bef76b1cac8dbcca597202ea84d9

Observation 41d189a1-ef31-4318-8e1e-9aee5dac5c9e · outbound

This paper cites Optical metrology: the long and unstoppable way to become an outstanding measuring tool,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optical metrology: the long and unstoppable way to become an outstanding measuring tool,

Reference 7

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Observation 4d09fc0c-00c3-406e-84d8-60d87ce429b6 · outbound

This paper cites Recent advances in traceable nanoscale dimension and force metrology in the UK,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Recent advances in traceable nanoscale dimension and force metrology in the UK,

Reference 8

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Observation 90b28e38-26e6-4ec4-a7d4-30f838eded71 · outbound

This paper cites Deep learning in optical metrology: a review,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Deep learning in optical metrology: a review,

Reference 9

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Observation c1d912cf-3a91-45f2-8be1-6d3db067a19d · outbound

This paper cites Metrology with a twist: probing and sensing with vortex light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Metrology with a twist: probing and sensing with vortex light,

Reference 10

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:76ccecf35ab36bd487945d240e540bdb55e6acb24a5b2f2fe105f1450e495beb

Observation f473f9de-f74c-4696-9b7b-8ac5e8235ceb · outbound

This paper cites Alignment-Free Nanometric Optical Metrology Enabled by Structured Light.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

Reference 11

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No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

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Observation 2228929c-450f-4912-a470-6bd61c7de16f · outbound

This paper cites Detecting nanometric displacements with optical ruler metrology,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Detecting nanometric displacements with optical ruler metrology,

Reference 12

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Observation f1ef2c75-9754-4e8e-93ef-1f74dae2e48e · outbound

This paper cites The michelson interferometer,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light The michelson interferometer,

Reference 13

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Observation ccca3e2f-cda4-413d-ba29-192e6046a37e · outbound

This paper cites A high-speed white-light scanning interferometer for bump inspection of semiconductor manufacture,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light A high-speed white-light scanning interferometer for bump inspection of semiconductor manufacture,

Reference 14

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Observation 794304f7-8f59-4be4-962f-d472a89cb727 · outbound

This paper cites Interferometric observations of rapidly rotating stars,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Interferometric observations of rapidly rotating stars,

Reference 15

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Observation fb8a9e62-573f-4777-baab-b1d3443f054f · outbound

This paper cites Interferometer techniques for gravitational- wave detection,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Interferometer techniques for gravitational- wave detection,

Reference 16

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Observation fe712fb2-57e5-4c10-b5c1-f712aff902c1 · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 17

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Observation 592c1255-216c-4973-8e90-6988c4151fb4 · outbound

This paper cites Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung,

Reference 18

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Observation b1d6cc14-0010-4ebf-b043-3d596884e932 · outbound

This paper cites Review of recent developments in stimulated emission depletion microscopy: applications on cell imaging,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Review of recent developments in stimulated emission depletion microscopy: applications on cell imaging,

Reference 19

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Observation 76230f67-d124-450b-bb53-993bdd13e6f7 · outbound

This paper cites Live-cell photoactivated localization microscopy of nanoscale adhesion dynamics,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Live-cell photoactivated localization microscopy of nanoscale adhesion dynamics,

Reference 20

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:7a0285ab92544ba8ead94ebb4725dd45bd464b5ce99e4380a700bce757c1f737

Observation e89d429c-dea6-4f95-8d67-fdc640db4884 · outbound

This paper cites Three-dimensional super-resolution imaging by stochastic optical reconstruction microscopy,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Three-dimensional super-resolution imaging by stochastic optical reconstruction microscopy,

Reference 21

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Observation dd3f8c73-066d-415c-8317-f8429ba81efd · outbound

This paper cites High-resolution, high-speed 3-d dynamically deformable shape measurement using digital fringe projection techniques,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light High-resolution, high-speed 3-d dynamically deformable shape measurement using digital fringe projection techniques,

Reference 22

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:1a2c76328d74dcb4a77ebe18167d5d84bb325315284f8eeec76ce9746e7e0bb9

Observation 0d28c325-024b-44a5-aa68-5038600ab6ae · outbound

This paper cites Phase measuring deflectometry: a new approach to measure specular free-form surfaces,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Phase measuring deflectometry: a new approach to measure specular free-form surfaces,

Reference 23

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Observation e1a2e46e-939b-4c99-9f27-94575c6577f2 · outbound

This paper cites Picophotonic localization metrology beyond thermal fluctuations,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Picophotonic localization metrology beyond thermal fluctuations,

Reference 24

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:c591764d8c1713c2ab7c8c978dee8417c5375aa79343aebcf3159d086fc03fd5

Observation 2c8f5ec7-fbe6-4cf4-bfd1-e830cb0171b1 · outbound

This paper cites 3D positional metrology of a virus-like nanoparticle with topologically structured light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light 3D positional metrology of a virus-like nanoparticle with topologically structured light,

Reference 25

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:2aca1719bba4bc592f22467f3502d998f33d283d182c50bc601c4c20c150042a

Observation 599fe624-6017-4c6c-800e-e5854bc13fef · outbound

This paper cites Adaptive Structured‐Light 3D Surface Imaging with Cross‐Domain Learning,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Adaptive Structured‐Light 3D Surface Imaging with Cross‐Domain Learning,

Reference 26

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:95e8bd067db5056aec473dac9ec02e35a16dc251b0e8c4a4d586848d8e22e50d

Observation 49b3267e-9759-45d7-bceb-b9bedfd34cc2 · outbound

This paper cites Retrieving positions of closely packed subwavelength nanoparticles from their diffraction patterns,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Retrieving positions of closely packed subwavelength nanoparticles from their diffraction patterns,

Reference 27

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:e024818c78d905681fa13301e0d0a15a7de6430e6b1efa9815b590c66a0126f5

Observation 35bd8aaa-bd5e-4e7f-9d24-ca1ddf560784 · outbound

This paper cites OpticalNet: An optical imaging dataset and benchmark beyond the diffraction limit,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light OpticalNet: An optical imaging dataset and benchmark beyond the diffraction limit,

Reference 28

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:9aeef2cfd4285841d334ee1c93a34b7baeea2357da5b0ed41576155c58168e97

Observation 76771d79-b846-4e69-aa58-93c1d8140a59 · outbound

This paper cites Unlabeled Far- Field Deeply Subwavelength Topological Microscopy (DSTM),.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unlabeled Far- Field Deeply Subwavelength Topological Microscopy (DSTM),

Reference 29

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verified exact
doi, observed 2026-06-26T10:29:18.802400Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

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Observation e9bdae35-f505-47cd-b58e-2e388d5a1016 · outbound

This paper cites 2D Super‐ Resolution Metrology Based on Superoscillatory Light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light 2D Super‐ Resolution Metrology Based on Superoscillatory Light,

Reference 30

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Observation e0e7f3c2-6a4c-4e35-a533-4771701d70c1 · outbound

This paper cites Optical vortices 30 years on: OAM manipulation from topological charge to multiple singularities,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optical vortices 30 years on: OAM manipulation from topological charge to multiple singularities,

Reference 31

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:2ecea71f416d9164c5ba835467d9580ca5db44eeb024066a1c653ff91bb98508

Observation 3340e72f-4809-4111-b44d-82e8303ad0a5 · outbound

This paper cites Structured light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Structured light,

Reference 32

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:bc6557b9e6cadf9d4241f5d47b68d4783eaea8cb5c29dc66cb678587ae24aaf7

Observation 6b7ab6ac-3660-4c26-8f8c-b2c4fbb29ecd · outbound

This paper cites Towards higher-dimensional structured light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Towards higher-dimensional structured light,

Reference 33

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:83ef69e05cfc43718733106cfecf1bcfae6024e59cd9a4d4854a973a6b5d6b0b

Observation cb2dfe22-d8dd-459a-aab9-543a99fd4463 · outbound

This paper cites Nano-optical metrology with phase singularities,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Nano-optical metrology with phase singularities,

Reference 34

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:41f878a06ac470d1519261ba561c22849a32d35d9cfaf775fd20e1b3be974b76

Observation 8c6ac651-6130-4b23-bedb-30e2d1698ddd · outbound

This paper cites Optical superoscillation technologies beyond the diffraction limit,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optical superoscillation technologies beyond the diffraction limit,

Reference 35

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:42178a2742aeb1c9802d96627b03c08bc455ce8f46587a30e4a0e5100e4e68b3

Observation 04cfae62-4cd9-4b8b-b48d-d68312bf813c · outbound

This paper cites Multidimensional phase singularities in nanophotonics,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Multidimensional phase singularities in nanophotonics,

Reference 36

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:e4652c023e8bca6778d51eff0d5eab9b2b31582b728af17fdd7a28a63c8f1ab4

Observation 9cf46204-3956-4978-89c6-37f38e3955ec · outbound

This paper cites Multifunctional binary diffractive optical elements for structured light projectors,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Multifunctional binary diffractive optical elements for structured light projectors,

Reference 37

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source=pdf_text observed=2026-06-26T10:23:08.677211Z digest=sha256:42649da03b9b1f983c32931ae36d979c4fdb6aa024ba6bc321def0f2b5f1a243

Observation e2f06a53-6655-42fd-b5c1-f6dfab362699 · outbound

This paper cites Metasurface-driven full-space structured light for three-dimensional imaging,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Metasurface-driven full-space structured light for three-dimensional imaging,

Reference 38

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This paper cites Structured illumination microscopy using digital micro-mirror device and coherent light source,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Structured illumination microscopy using digital micro-mirror device and coherent light source,

Reference 39

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This paper cites What spatial light modulators can do for optical microscopy,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light What spatial light modulators can do for optical microscopy,

Reference 40

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This paper cites Digitally tailoring arbitrary structured light of generalized ray-wave duality,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Digitally tailoring arbitrary structured light of generalized ray-wave duality,

Reference 41

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This paper cites Deep residual learning for image recognition,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Deep residual learning for image recognition,

Reference 42

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Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Wide Residual Networks

Reference 43

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Observation 8d6cfe9f-aad5-455b-be6e-b75ab5e18b0c · outbound

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Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Image super-resolution via deep recursive residual network,

Reference 44

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Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Residual attention network for image classification,

Reference 45

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Observation d6ab5ca0-37b4-4b76-b9d4-e17dacc7dd6b · outbound

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Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Background prior-based salient object detection via deep reconstruction residual,

Reference 46

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Observation dbcaebe9-0da0-4c5d-bff5-65481753d3ad · outbound

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Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Full-resolution residual networks for semantic segmentation in street scenes,

Reference 47

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Observation 0a8e18d0-4bbb-449b-bc25-e770732543b6 · outbound

This paper cites A study of the optimization algorithms in deep learning,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light A study of the optimization algorithms in deep learning,

Reference 48

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Observation 76c0a980-fd2b-4a09-9fb3-b851bb005343 · outbound

This paper cites Photonic torons with 3D topology transitions and tunable spin monopoles,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Photonic torons with 3D topology transitions and tunable spin monopoles,

Reference 49

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Observation bd913318-03e1-4c74-89e6-4e33feb67508 · outbound

This paper cites Optimal beam-displacement measurements using high-order structured light modes,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optimal beam-displacement measurements using high-order structured light modes,

Reference 50

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Pith citing papers

Observation 036d4915-234a-4033-a173-e22034cc5b3f · inbound

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light cites this paper.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

Reference 6

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Observation f473f9de-f74c-4696-9b7b-8ac5e8235ceb · inbound

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light cites this paper.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

Reference 11

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