Paper Citation Record · LEDGER

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators

As of 11 August 2026, this Paper Citation Record lists 12 of 12 outbound references and 1 inbound Pith citation observation for arXiv:2607.02238.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.02238 v1

Coverage vector

measured 12 of 12 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-07-03T09:27:33.357575Z

measured 13 of 13 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-11T06:34:44.6726+00:00

measured 1 of 1 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-01T05:13:28.530736Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: pith, observed 2026-08-01T06:16:24.888925Z

Reference resolution

12 of 12 outbound references displayed

verified exact0
verified fuzzy11
unresolved1
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 1742bfd9-763b-4f9b-8b3c-c881e921c84d · outbound

This paper cites Tantalum Thin Films Sputtered on Silicon and on Different Seed Layers: Material Characterization and Coplanar Waveguide Resonator Performance,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Tantalum Thin Films Sputtered on Silicon and on Different Seed Layers: Material Characterization and Coplanar Waveguide Resonator Performance,

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.554399Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation ce786ad3-9f06-43d8-bc32-4045aefa4eeb · outbound

This paper cites Development of TiN/AlN-Based Superconducting Qubit Components,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Development of TiN/AlN-Based Superconducting Qubit Components,

Reference 2

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.582051Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 169a334a-96f5-49d2-bd9f-927edfe97984 · outbound

This paper cites an unresolved cited work.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Unresolved cited work

Reference 3

Resolution: unresolved; raw_fallback, observed 2026-07-05T09:50:57.586541Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 398680b8-c552-4506-bcb1-ec66f5795675 · outbound

This paper cites Williamson-Hall analysis in estimation of lattice strain in nanometer-sized ZnO particles,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Williamson-Hall analysis in estimation of lattice strain in nanometer-sized ZnO particles,

Reference 4

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.576191Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation f13548d4-90d7-4e07-86cc-4615165bac1f · outbound

This paper cites On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials,

Reference 5

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.561450Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 68ae1c4c-c526-44f8-9cb4-49da770c3d9b · outbound

This paper cites Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films,

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.563665Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 18307ea4-25b5-4098-a5e7-e457dbfecb30 · outbound

This paper cites X-ray analysis of ZnO nanoparticles by Williamson–Hall and size–strain plot methods,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators X-ray analysis of ZnO nanoparticles by Williamson–Hall and size–strain plot methods,

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.573533Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation f2a11208-48fd-4d30-9c3e-a121dd43c8d0 · outbound

This paper cites Evaluation of lattice strain in ZnO thin films based on Williamson-Hall analysis,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Evaluation of lattice strain in ZnO thin films based on Williamson-Hall analysis,

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.558684Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 26182886-8f5e-42ee-ad07-591145325479 · outbound

This paper cites Birkholz,Thin Film Analysis by X-Ray Scattering.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Birkholz,Thin Film Analysis by X-Ray Scattering

Reference 9

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.570180Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 005038d4-3edc-430f-a885-7af6bca57fd0 · outbound

This paper cites Effect of sputtering parameters and substrate composition on the structure of tantalum thin films,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Effect of sputtering parameters and substrate composition on the structure of tantalum thin films,

Reference 10

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.579814Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 43ba9480-76df-4ce6-b3b6-02da696ead4b · outbound

This paper cites Lattice dynamics of the niobium (001) surface,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Lattice dynamics of the niobium (001) surface,

Reference 11

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.584533Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Observation 8d755ab0-c6b3-47f9-8a73-aca79eae8530 · outbound

This paper cites Structure and Electrical Properties of Titanium Nitride Films,.

Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators Structure and Electrical Properties of Titanium Nitride Films,

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-07-05T09:50:57.556523Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.

Pith citing papers

Observation 8d282d44-c627-47fb-b460-2af60b591551 · inbound

Substrate-metal interface engineering enhances TaN/Ta thin film superconducting resonator performance cites this paper.

Substrate-metal interface engineering enhances TaN/Ta thin film superconducting resonator performance Interfacial Strain and Structural Defects Govern the Performance of Tantalum Superconducting Waveguide Resonators

Reference 35

Resolution: verified exact; local_arxiv, observed 2026-08-01T05:18:35.064398Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.