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Paper Citation Record · LEDGER

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination

As of 7 August 2026, this Paper Citation Record lists 29 of 29 outbound references and 0 inbound Pith citation observations for arXiv:2607.08856.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.08856 v1

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Reference resolution

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Outbound references

Observation f7cddf14-7215-4b4e-b84d-52f6c48547ff · outbound

This paper cites What an Amortized X-ray Posterior Cannot See: Gain Shifts, Silent Miscalibration, and the Limits of the Evidence Check.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination What an Amortized X-ray Posterior Cannot See: Gain Shifts, Silent Miscalibration, and the Limits of the Evidence Check

Reference 1

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Observation 0b2fddba-0f13-4eb0-934d-31a013a80492 · outbound

This paper cites Tests for model misspecification in simulation- based inference: From local distortions to global model checks.Physical Review D, 111(8):083013, 2025.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Tests for model misspecification in simulation- based inference: From local distortions to global model checks.Physical Review D, 111(8):083013, 2025

Reference 2

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Observation 2b8cd10a-7118-49cf-8149-420d560bf08b · outbound

This paper cites Calibrating gravitational-wave search al- gorithms with conformal prediction.Physical Review D, 109(12):123027, 2024.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Calibrating gravitational-wave search al- gorithms with conformal prediction.Physical Review D, 109(12):123027, 2024

Reference 3

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Observation 38347644-08fe-4e20-ab5d-97ae0f38415d · outbound

This paper cites Revised catalog of GALEX ultraviolet sources.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Revised catalog of GALEX ultraviolet sources

Reference 4

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Observation a9d69c3c-afc3-460b-b8ca-a312b52396b5 · outbound

This paper cites UltraNest – a robust, general purpose Bayesian inference engine.Journal of Open Source Software, 6(60):3001, 2021.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination UltraNest – a robust, general purpose Bayesian inference engine.Journal of Open Source Software, 6(60):3001, 2021

Reference 5

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Observation 9fb24954-e4d7-49af-80a8-5f1aeafb45b7 · outbound

This paper cites Investigating the Impact of Model Misspecification in Neural Simulation-based Inference.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Investigating the Impact of Model Misspecification in Neural Simulation-based Inference

Reference 6

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Observation a1bd0671-0805-4807-8629-db8c1f4e92c2 · outbound

This paper cites De Angeli, M.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination De Angeli, M

Reference 7

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Observation bb585b22-20fc-433d-90e0-588431a99ab5 · outbound

This paper cites Vallenari, A.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Vallenari, A

Reference 9

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Observation 7f40d9e4-d571-4352-92a5-40bfacdb3737 · outbound

This paper cites A random forest spectral classification of the Gaia 500-pc white dwarf population.Astronomy & Astrophysics, 699: A3, 2025.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination A random forest spectral classification of the Gaia 500-pc white dwarf population.Astronomy & Astrophysics, 699: A3, 2025

Reference 10

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Observation e03aca40-2ea4-4893-aebb-92d0bf929e8d · outbound

This paper cites an unresolved cited work.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Unresolved cited work

Reference 11

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Observation f2a8699b-db93-4cce-8f3b-436aec960a23 · outbound

This paper cites A Trust Crisis In Simulation-Based Inference? Your Posterior Approximations Can Be Unfaithful.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination A Trust Crisis In Simulation-Based Inference? Your Posterior Approximations Can Be Unfaithful

Reference 12

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Observation 6842d725-d493-455d-800b-3af469bdcef4 · outbound

This paper cites A comprehensive correction of the Gaia DR3 XP spectra.The Astrophysical Journal Supplement Series, 271(1):13, 2024.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination A comprehensive correction of the Gaia DR3 XP spectra.The Astrophysical Journal Supplement Series, 271(1):13, 2024

Reference 13

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Observation 6c8e48fc-9cbd-4b22-bae9-7cd60a338d88 · outbound

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A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Unresolved cited work

Reference 14

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Observation 938b299b-f384-4058-bb08-9b0cc0ccf285 · outbound

This paper cites Green, and Xiangyu Zhang.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Green, and Xiangyu Zhang

Reference 15

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Observation a5f3de83-aa0e-4e61-8973-fbd43097e2a0 · outbound

This paper cites Green, David W.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Green, David W

Reference 16

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Observation 72be1ebb-96d2-4cc3-9242-5511df898a7a · outbound

This paper cites Christopher Martin, James Fanson, David Schiminovich, Patrick Morrissey, Peter G.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Christopher Martin, James Fanson, David Schiminovich, Patrick Morrissey, Peter G

Reference 17

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Observation 3f0b8d22-cbd8-497b-a191-ad45b91427f1 · outbound

This paper cites Montegriffo, F.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Montegriffo, F

Reference 18

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Observation fd1f2b11-b0c5-40c8-8da1-dcd7cbafde66 · outbound

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A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Unresolved cited work

Reference 19

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Observation 8fdd3d58-3de3-40a0-9b95-bd72441824f9 · outbound

This paper cites Finding white dwarfs’ hidden companions using an unsupervised machine learning technique.The Astrophysical Journal, 988(1):51, 2025.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Finding white dwarfs’ hidden companions using an unsupervised machine learning technique.The Astrophysical Journal, 988(1):51, 2025

Reference 20

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Observation 10620005-6548-47f6-828e-7599b5d91a46 · outbound

This paper cites Rebassa-Mansergas, J.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Rebassa-Mansergas, J

Reference 21

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Observation 74bae12d-d05c-42ce-9015-de0dd986a962 · outbound

This paper cites Brown, Steven G.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Brown, Steven G

Reference 22

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A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Unresolved cited work

Reference 23

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Observation 3e2fce3c-b607-495c-901b-7d2ff84733f7 · outbound

This paper cites Riello, F.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Riello, F

Reference 24

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Observation 18cf2c5a-115b-4fcf-a0d5-274c1ba7694a · outbound

This paper cites Triage of the Gaia DR3 astrometric orbits.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Triage of the Gaia DR3 astrometric orbits

Reference 25

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Observation aebfed5b-e0e1-4a8a-93d3-5ee67e6eacd6 · outbound

This paper cites Triage of the Gaia DR3 astrometric orbits.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Triage of the Gaia DR3 astrometric orbits

Reference 26

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Observation 0923606c-b2b1-46da-a7c6-f02723cc01e6 · outbound

This paper cites Validating Bayesian Inference Algorithms with Simulation-Based Calibration.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Validating Bayesian Inference Algorithms with Simulation-Based Calibration

Reference 27

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Observation 7dcaa028-5c88-4c7b-8dcc-98c09eb565bf · outbound

This paper cites Gonçalves, David S.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Gonçalves, David S

Reference 28

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Observation 5204f50c-19f9-4130-9f57-be2af4a28a5c · outbound

This paper cites Neural posterior estimation for white dwarf spectroscopic characterization.arXiv e-prints, 2025.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Neural posterior estimation for white dwarf spectroscopic characterization.arXiv e-prints, 2025

Reference 29

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This paper cites Robust Neural Posterior Estimation and Statistical Model Criticism.

A Calibration Audit of a Gaia XP White-Dwarf Main-Sequence Binary Catalog: How Much BP-Band Residual it Takes to Manufacture Contamination Robust Neural Posterior Estimation and Statistical Model Criticism

Reference 30

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