Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-01T07:54:28.196205Z
Paper Citation Record · LEDGER
Visualization of Defect Electronic States in Layered Semiconductor CrSBr
As of 4 August 2026, this Paper Citation Record lists 11 of 11 outbound references and 0 inbound Pith citation observations for arXiv:2607.21301.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-04T06:34:03.388597+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
11 of 11 outbound references displayed
- verified exact8
- verified fuzzy0
- unresolved3
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 0b8f1115-592b-45e3-bf9f-a3d01e5a8dde · outbound
This paper cites Defect Engineering in 2D Materials: Precise Manipulation and Improved Functionalities.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr Defect Engineering in 2D Materials: Precise Manipulation and Improved Functionalities
Reference 1
- Resolution
- unresolved
- no resolver link, observed 2026-08-01T07:54:27.135616Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 4f774d96-e9f8-4441-9e2d-a657ed2fa020 · outbound
This paper cites M.; Luican-Mayer, A.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr M.; Luican-Mayer, A
Reference 9
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:25.284585Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation 49e75d27-6152-4da6-b551-c8a8d192e26c · outbound
This paper cites (29) Defects in Two-Dimensional Materials, 1st ed.; Addou, R., Colombo, L., Eds.; Materials Today; Elsevier: Amsterdam, Netherlands,.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr (29) Defects in Two-Dimensional Materials, 1st ed.; Addou, R., Colombo, L., Eds.; Materials Today; Elsevier: Amsterdam, Netherlands,
Reference 54
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:25.042990Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation 321e8205-6dfb-43b9-a1c5-68d757042b88 · outbound
This paper cites (33) Perdew, J.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr (33) Perdew, J
Reference 106
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:24.837749Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation 527eb2f9-5325-434b-a809-175e4b19f72e · outbound
This paper cites (6) Tang, K.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr (6) Tang, K
Reference 410
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:25.342514Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation cf6ec397-19af-4174-b4eb-f420dc1fef0c · outbound
This paper cites (15) Feuer, M.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr (15) Feuer, M
Reference 1853
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:25.219205Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation 3ab9331d-b720-44de-ad24-dd14358d8ac2 · outbound
This paper cites (2) Tongay, S.; Suh, J.; Ataca, C.; Fan, W.; Luce, A.; Kang, J.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr (2) Tongay, S.; Suh, J.; Ataca, C.; Fan, W.; Luce, A.; Kang, J
Reference 2019
- Resolution
- unresolved
- no resolver link, observed 2026-08-01T07:54:27.174194Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 4d58c581-fd2e-4a10-8a97-7cd89ab60c60 · outbound
This paper cites A.; Lee, J.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr A.; Lee, J
Reference 2022
- Resolution
- unresolved
- no resolver link, observed 2026-08-01T07:54:27.878228Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation aac9d471-90f1-46c5-add7-829b0851f30d · outbound
This paper cites Über Chalkogenidhalogenide Des Chroms Synthese, Kristallstruktur Und Magnetismus von Chromsulfidbromid, CrSBr.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr Über Chalkogenidhalogenide Des Chroms Synthese, Kristallstruktur Und Magnetismus von Chromsulfidbromid, CrSBr
Reference 2026
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:25.154257Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation 73db8460-140e-4db5-8f89-6de8ac239466 · outbound
This paper cites (3) Greben, K.; Arora, S.; Harats, M.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr (3) Greben, K.; Arora, S.; Harats, M
Reference 2657
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:25.434003Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation 841fa796-58dc-47a4-89a8-1d623850dad4 · outbound
This paper cites 21 (31) Nguyen, G.
Visualization of Defect Electronic States in Layered Semiconductor CrSBr 21 (31) Nguyen, G
Reference 7287
- Resolution
- verified exact
- doi, observed 2026-08-01T07:58:24.946526Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Pith citing papers
No inbound Pith citation observations are available.