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Integrity report for Role of defects in the electronic properties of amorphous/crystalline Si interface

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:cond-mat/0102399 · pith:2001:2W7KYBA24WM2M77HFP2JO5JNEB

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Paper page arXiv integrity.json bundle.json

Detector runs

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Signed record

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