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Integrity report for Electronic Structure of the Ferromagnetic Semiconductor Fe-doped Ge Revealed by Soft X-ray Angle-Resolved Photoemission Spectroscopy

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1605.05275 · pith:2016:2WMG3HC43L2KU2FE7WQDXLG4V4

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Paper page arXiv integrity.json bundle.json

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Signed record

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