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Integrity report for Fabrication and characterization of semiconducting half Heusler YPtSb thin films

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1209.6288 · pith:2012:3633UNLDMAVJMELB4RLX3BTMCS

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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