Paper Citation Record · LEDGER

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis

As of 18 August 2026, this Paper Citation Record lists 34 of 34 outbound references and 0 inbound Pith citation observations for arXiv:2505.04679.

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pith.paper-citation-record.v1
2505.04679 v1

Coverage vector

measured 34 of 34 reference resolution

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Pith citing papers itemized under the disclosed page cap.

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Reference resolution

34 of 34 outbound references displayed

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External citation measurements

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Outbound references

Observation 7b8142d5-3a1f-46d7-81b5-168bf0406a06 · outbound

This paper cites External Beam IBA Measurements for Cultural Heritage,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis External Beam IBA Measurements for Cultural Heritage,

Reference 1

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Observation cb1df92e-1956-44c7-a740-8a9f36c9697f · outbound

This paper cites Time-of-flight secondary ion mass spectrometry imaging in cultural heritage: A focus on old paintings,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Time-of-flight secondary ion mass spectrometry imaging in cultural heritage: A focus on old paintings,

Reference 2

Resolution: verified exact; doi, observed 2026-08-15T23:32:31.094142Z

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Observation db8020c2-f265-4e78-9735-810dd270a3aa · outbound

This paper cites Towards nanometric resolution in multilayer depth profiling: A comparative study of RBS, SIMS, XPS and GDOES,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Towards nanometric resolution in multilayer depth profiling: A comparative study of RBS, SIMS, XPS and GDOES,

Reference 3

Resolution: verified exact; doi, observed 2026-08-15T23:32:31.080873Z

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Observation 8c664154-a2cb-47a8-8db6-e2f0ad31a202 · outbound

This paper cites Comparison of depth profiling techniques using ion sputtering from the practical point of view,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Comparison of depth profiling techniques using ion sputtering from the practical point of view,

Reference 4

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Observation 66e7c860-1a33-4df3-97b6-f8aaca1aa65d · outbound

This paper cites A deep view in cultural heritage-confocal micro X-ray spectroscopy for depth resolved elemental analysis,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis A deep view in cultural heritage-confocal micro X-ray spectroscopy for depth resolved elemental analysis,

Reference 5

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Observation 6373b34d-9162-4cb8-b5af-5ae64d7540a9 · outbound

This paper cites The Role of PIXE and XRF in Heritage Science: The INFN-CHNet LABEC Experience,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis The Role of PIXE and XRF in Heritage Science: The INFN-CHNet LABEC Experience,

Reference 6

Resolution: verified exact; doi, observed 2026-08-15T23:32:31.061785Z

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Observation 9f32fe8a-44cf-4397-be43-f44418947acc · outbound

This paper cites Bezur, L.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Bezur, L

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T23:32:31.368765Z

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Observation 0ba1115e-616a-46bc-9f43-afa44312608d · outbound

This paper cites Muon spin spectroscopy,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Muon spin spectroscopy,

Reference 8

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Observation c436adf5-1f9a-42ec-89de-4d5d8e8fa4f0 · outbound

This paper cites an unresolved cited work.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Unresolved cited work

Reference 9

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Observation 68526fc4-0d19-4e9b-8cd8-43ce9a7b3339 · outbound

This paper cites A Novel Non-Destructive Technique for Cultural Heritage: Depth Profiling and Elemental Analysis Underneath the Surface with Negative Muons,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis A Novel Non-Destructive Technique for Cultural Heritage: Depth Profiling and Elemental Analysis Underneath the Surface with Negative Muons,

Reference 10

Resolution: verified exact; doi, observed 2026-08-15T23:32:31.041878Z

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No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation de86deaa-b495-47cf-99fb-48fb90bc4140 · outbound

This paper cites Development of elemental analysis by muonic X-ray measurement in J- PARC,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Development of elemental analysis by muonic X-ray measurement in J- PARC,

Reference 11

Resolution: verified exact; doi, observed 2026-08-15T23:32:31.029361Z

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Observation 99241021-3d93-4531-8857-d15b27a3b57f · outbound

This paper cites Elemental Analysis of Bronze Artifacts by Muonic X-ray Spectroscopy,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Elemental Analysis of Bronze Artifacts by Muonic X-ray Spectroscopy,

Reference 12

Resolution: verified exact; doi, observed 2026-08-15T23:32:31.018211Z

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Observation 60d9f132-be05-4330-8a23-2c4ec19e1704 · outbound

This paper cites Understanding Roman Gold Coinage Inside Out,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Understanding Roman Gold Coinage Inside Out,

Reference 13

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Observation 1d1f6530-c7b9-4ba5-a8b3-1bb5727dce6f · outbound

This paper cites The non-destructive investigation of a late antique knob bow fibula (Bügelknopffibel) from Kaiseraugst/CH using Muon Induced X-ray Emission (MIXE),.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis The non-destructive investigation of a late antique knob bow fibula (Bügelknopffibel) from Kaiseraugst/CH using Muon Induced X-ray Emission (MIXE),

Reference 14

Resolution: verified exact; doi, observed 2026-08-15T23:32:31.006526Z

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Observation 5b893d2f-74fe-4599-bd08-d08b585940e7 · outbound

This paper cites Use of Muonic X Rays for Nondestructive Analysis of Bulk Samples for Low Z Constituents,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Use of Muonic X Rays for Nondestructive Analysis of Bulk Samples for Low Z Constituents,

Reference 15

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.995487Z

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Observation c97dafe5-94a9-4bdd-aa30-c4b972f63502 · outbound

This paper cites Application of muonic X-ray techniques to the elemental analysis of archeological objects,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Application of muonic X-ray techniques to the elemental analysis of archeological objects,

Reference 16

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.984851Z

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Observation 453ab919-0805-4dd0-83fe-4006d453e80b · outbound

This paper cites FLUKA: A multi-particle transport code (Program version 2005),.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis FLUKA: A multi-particle transport code (Program version 2005),

Reference 17

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Observation 4492f1ef-5d6f-4e9e-8ef0-f7a3a24d81e1 · outbound

This paper cites GEANT4 - A simulation toolkit,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis GEANT4 - A simulation toolkit,

Reference 18

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Observation 3227ad22-e320-4d7c-b5a1-7c6691caf64b · outbound

This paper cites MCNP User Manual . Code Versione 6.2,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis MCNP User Manual . Code Versione 6.2,

Reference 19

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Observation 67bd1f42-ce60-4549-88ca-e3727e310d52 · outbound

This paper cites The projected background for the CUORE experiment,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis The projected background for the CUORE experiment,

Reference 20

Resolution: unresolved; no resolver link, observed 2026-08-15T23:32:30.786938Z

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Observation 6fbc969f-f262-4e99-9796-6e924547a5dd · outbound

This paper cites Measurement of the two-neutrino double-beta decay half-life of $$^{130}$$Te with the CUORE-0 experiment,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Measurement of the two-neutrino double-beta decay half-life of $$^{130}$$Te with the CUORE-0 experiment,

Reference 21

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Observation bcdd631b-fe11-4bac-b065-02631d78ad8e · outbound

This paper cites SRIM – The stopping and range of ions in matter (2010),.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis SRIM – The stopping and range of ions in matter (2010),

Reference 22

Resolution: unresolved; no resolver link, observed 2026-08-15T23:32:30.793787Z

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Observation 49dbd080-7658-46b8-84b8-d0917075fbb7 · outbound

This paper cites Thickness determination of metal multilayers by ED-XRF multivariate analysis using Monte Carlo simulated standards,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Thickness determination of metal multilayers by ED-XRF multivariate analysis using Monte Carlo simulated standards,

Reference 23

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.935992Z

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Observation 0750ff10-0c06-457e-a8ba-4f706113c819 · outbound

This paper cites Monte Carlo simulations of XRF intensities in non- homogeneous matrices,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Monte Carlo simulations of XRF intensities in non- homogeneous matrices,

Reference 24

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.925865Z

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Observation be54eef3-297f-403e-b02e-390ebaf77f44 · outbound

This paper cites The Implementation of MuDirac in Geant4: A Preliminary Approach to the Improvement of the Simulation of the Muonic Atom Cascade Process,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis The Implementation of MuDirac in Geant4: A Preliminary Approach to the Improvement of the Simulation of the Muonic Atom Cascade Process,

Reference 25

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.914883Z

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Observation 61decc16-ea45-4c92-884a-8f3963c37bdb · outbound

This paper cites The practice and characterization of historic fire gilding techniques,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis The practice and characterization of historic fire gilding techniques,

Reference 26

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.904421Z

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Observation 600a1cc4-c861-4a92-b323-83d0d90417ad · outbound

This paper cites Gilding through the ages,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Gilding through the ages,

Reference 27

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.894119Z

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Observation d4ed0937-c4da-469d-bf64-34746ceba927 · outbound

This paper cites Plating and Surface Treatments on Ancient Metalwork,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Plating and Surface Treatments on Ancient Metalwork,

Reference 28

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correction dated 2025-05-22. Source: crossref record 10.1016/j.aia.2025.100045->10.1016/j.aia.2020.10.001:correction, observed 2026-07-11T03:15:51.346103+00:00. This notice travels one citation hop only.

Observation f91ffeca-21a2-41e4-b3b9-670c63492f38 · outbound

This paper cites Electroplating for decorative applications: Recent trends in research and development,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Electroplating for decorative applications: Recent trends in research and development,

Reference 29

Resolution: verified exact; doi, observed 2026-08-15T23:32:30.872910Z

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Observation 118958a7-c2ca-4e4c-a76d-d4236fdad6e5 · outbound

This paper cites Muons at ISIS,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Muons at ISIS,

Reference 30

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Observation 2ea72755-52d2-497f-bbce-4082284508b0 · outbound

This paper cites The RIKEN-RAL pulsed Muon Facility,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis The RIKEN-RAL pulsed Muon Facility,

Reference 31

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T23:32:31.335491Z

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Observation 9b723d2a-1013-4ccc-ab7b-c85b044503a0 · outbound

This paper cites Electronic catalogue of muonic X-rays,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Electronic catalogue of muonic X-rays,

Reference 32

Resolution: verified exact; raw_fallback, observed 2026-08-15T23:32:31.198127Z

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Observation 83f1a38d-7ab5-4b42-b1b9-292e53ad1cf9 · outbound

This paper cites Charge-distribution parameters, isotope shifts, isomer shifts, and magnetic hyperfine constanst from muonic atoms,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Charge-distribution parameters, isotope shifts, isomer shifts, and magnetic hyperfine constanst from muonic atoms,

Reference 33

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T23:32:31.324432Z

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Observation f05bf6cd-83d4-471b-8ea1-4b78545831ec · outbound

This paper cites Mudirac: A Dirac equation solver for elemental analysis with muonic X-rays,.

Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis Mudirac: A Dirac equation solver for elemental analysis with muonic X-rays,

Reference 34

Resolution: unresolved; no resolver link, observed 2026-08-15T23:32:30.834633Z

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