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Integrity report for Time dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensors

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1305.0398 · pith:2013:3IQCSS6ESU6PLUH55LQKEFJ7O7

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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