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Integrity report for Achieving sub-1 Ohm-mm Non-Recess S/D Contact Resistance in GaN HEMTs Utilizing Simple CMOS Compatible La/Ti/Al/Ti Metal Contacts

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1902.00227 · pith:2019:3JXIUUT45MJTTXV2LBNADH6DSO

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Paper page arXiv integrity.json bundle.json

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Signed record

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