Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-05-19T15:21:06.137779Z
Paper Citation Record · LEDGER
Radio-frequency reflectometry in silicon carbide large-area transistors
As of 20 August 2026, this Paper Citation Record lists 39 of 39 outbound references and 0 inbound Pith citation observations for arXiv:2605.15389.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-20T06:33:59.587034+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
39 of 39 outbound references displayed
- verified exact1
- verified fuzzy17
- unresolved20
- parse uncertain0
- malformed identifier1
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation e17f2efa-a7e0-46d3-a1e8-0c5a57d7a611 · outbound
This paper cites Our aluminium bond wires have a length ofl≈5 mm and diameter 50µm (r= 25µm), henceL bw ≈5 nH.
Radio-frequency reflectometry in silicon carbide large-area transistors Our aluminium bond wires have a length ofl≈5 mm and diameter 50µm (r= 25µm), henceL bw ≈5 nH
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.675564Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 79f20fce-eb58-4ba3-9273-6a36457d1b01 · outbound
This paper cites Substitutingl= 5 mm andr= 25µm givesR bw,dc ≈0.07 Ω.
Radio-frequency reflectometry in silicon carbide large-area transistors Substitutingl= 5 mm andr= 25µm givesR bw,dc ≈0.07 Ω
Reference 2
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.670289Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 5ae90a80-c8ce-4d5e-a33f-0f94ed118cdb · outbound
This paper cites Using a typical PCB trace in- ductance of order 1 nH/mm and measured trace lengths of approximately 10–15 mm yields inductance values re- ported in Table I.
Radio-frequency reflectometry in silicon carbide large-area transistors Using a typical PCB trace in- ductance of order 1 nH/mm and measured trace lengths of approximately 10–15 mm yields inductance values re- ported in Table I
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.728245Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 5c8c4624-6629-42e1-a692-6555354b9963 · outbound
This paper cites Substitution givesC p ≈4 pF.
Radio-frequency reflectometry in silicon carbide large-area transistors Substitution givesC p ≈4 pF
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.734619Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 0591bc35-2e80-4214-9606-730671bb1131 · outbound
This paper cites The values are taken atV DS = 0.
Radio-frequency reflectometry in silicon carbide large-area transistors The values are taken atV DS = 0
Reference 5
- Resolution
- malformed identifier
- raw_fallback, observed 2026-05-19T15:22:37.701609Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 89298466-f101-481c-910c-f029da4a1f89 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 6
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.694543Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 65636aa2-b0ca-44aa-af94-3d35467c26ff · outbound
This paper cites Hence, we argue that also contact resistances must increase dramatically.
Radio-frequency reflectometry in silicon carbide large-area transistors Hence, we argue that also contact resistances must increase dramatically
Reference 7
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.697425Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation b421bd2f-9030-4062-b342-fc8a845b62c0 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 8
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.714221Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 503d4fb6-437b-4a3d-8890-ae874fc39607 · outbound
This paper cites Vigneau, F.
Radio-frequency reflectometry in silicon carbide large-area transistors Vigneau, F
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.730346Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 0f278484-4876-4823-9976-aabb0037ee8d · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 10
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.679638Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 6e960697-07e6-4307-bdae-c4e0b26f4ba0 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 11
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.683923Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation bbcca452-5b3f-4127-b2f4-aa671db758e2 · outbound
This paper cites Schaal, A.
Radio-frequency reflectometry in silicon carbide large-area transistors Schaal, A
Reference 12
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.732488Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation aab2dc11-d546-478e-9acd-2513b3c082e8 · outbound
This paper cites Ruffino, T.-Y.
Radio-frequency reflectometry in silicon carbide large-area transistors Ruffino, T.-Y
Reference 13
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.648821Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 9a03ba89-af94-4214-afaa-a737b6437cd2 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 14
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.672829Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 926c9acb-ade5-45b4-8ac9-3db4bf3cc3d4 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 15
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.718749Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation db9d4670-10b5-4d72-87e2-40b45ad873eb · outbound
This paper cites Scappucci, C.
Radio-frequency reflectometry in silicon carbide large-area transistors Scappucci, C
Reference 16
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.651729Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation c69e7421-2a7b-4910-95ac-dd6a4ec06dcc · outbound
This paper cites Banerjee, C.
Radio-frequency reflectometry in silicon carbide large-area transistors Banerjee, C
Reference 17
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.736629Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 4929b2f5-8568-435b-a0d2-bfe6926d49f9 · outbound
This paper cites Kimoto, Material science and device physics in SiC technology for high-voltage power devices, Japanese Journal of Applied Physics54, 040103 (2015).
Radio-frequency reflectometry in silicon carbide large-area transistors Kimoto, Material science and device physics in SiC technology for high-voltage power devices, Japanese Journal of Applied Physics54, 040103 (2015)
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.721192Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation b7191aaf-5374-43e1-9e18-4d712ed14f97 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 19
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.707960Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 9f70d560-0a40-44fe-a144-2ad98f286af6 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 20
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.710069Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation f1f2327b-7bd7-4ac2-809c-91179513b1b0 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 21
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.705729Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 8e403afb-3119-4924-a851-436ac67dddfa · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 22
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.712074Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation fbde705f-83e0-480b-97be-43a9914b84d1 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 23
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.716529Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation b154c625-ad49-4f7f-98d4-0147eaf6c8ae · outbound
This paper cites Baliga,Fundamentals of Power Semiconductor De- vices(Springer New York, NY, 2008).
Radio-frequency reflectometry in silicon carbide large-area transistors Baliga,Fundamentals of Power Semiconductor De- vices(Springer New York, NY, 2008)
Reference 24
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.654842Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 0a87b1a7-634b-407a-8569-065aa128cf67 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 25
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.699505Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 387bbcb7-78db-419a-be4e-c49361119ca4 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 26
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.692376Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation cb3d4401-9e2b-418c-97b0-ee82b96a04f0 · outbound
This paper cites Powell, E.
Radio-frequency reflectometry in silicon carbide large-area transistors Powell, E
Reference 27
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.688295Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 74d54c57-7f99-49a6-8443-9666b65ff8f8 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 28
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.690384Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 615d2714-ec9b-4f59-8ec3-a87f777ed9cb · outbound
This paper cites Nikolova, J.
Radio-frequency reflectometry in silicon carbide large-area transistors Nikolova, J
Reference 29
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.723411Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation c569a069-76ca-4038-9475-235b8a69fa8a · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 30
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.681763Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 14429552-4808-495e-aa48-a06ee0527362 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 31
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.686186Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 4e9d90bd-c503-4937-80bc-65cdb905721c · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 32
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.677713Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 8992ce0b-416a-440f-8df4-db90f64400ce · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 33
- Resolution
- verified exact
- doi, observed 2026-05-19T15:22:37.202569Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation bbf26d7c-5eee-4f19-a3aa-178a0ebd799d · outbound
This paper cites Kimoto and J.
Radio-frequency reflectometry in silicon carbide large-area transistors Kimoto and J
Reference 34
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.725691Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 278e26b1-5697-4587-ace4-b240e62460a5 · outbound
This paper cites Robert, S.
Radio-frequency reflectometry in silicon carbide large-area transistors Robert, S
Reference 35
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.664230Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 63c2df1b-2c42-40e2-85a0-43d8e36fbbf2 · outbound
This paper cites Pernot, S.
Radio-frequency reflectometry in silicon carbide large-area transistors Pernot, S
Reference 36
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T15:22:37.703693Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 77a2aee8-84a4-4368-91ba-5b5cb8a18f13 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 37
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.661648Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 884629b8-1abf-4065-bfb9-43d477d7d671 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 38
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.667070Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Observation 61abeff1-dbd2-4597-8ad5-57f7e8be80b9 · outbound
This paper cites an unresolved cited work.
Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work
Reference 39
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T15:22:37.658447Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.
Pith citing papers
No inbound Pith citation observations are available.