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Integrity report for Charge transfer and tunable built-in electric fields across semiconductor-crystalline oxide interfaces

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1810.04648 · pith:2018:3TS3COBWELU2JHIDQSP6BGDNEI

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Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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