pith. sign in

arxiv: 1707.02899 · v2 · pith:42ITZYFCnew · submitted 2017-07-10 · 🧮 math.CO

On the metric dimension of incidence graphs

classification 🧮 math.CO
keywords graphsdimensiongammaincidencemetricsymmetricbipartitedesigns
0
0 comments X
read the original abstract

A resolving set for a graph $\Gamma$ is a collection of vertices $S$, chosen so that for each vertex $v$, the list of distances from $v$ to the members of $S$ uniquely specifies $v$. The metric dimension $\mu(\Gamma)$ is the smallest size of a resolving set for $\Gamma$. We consider the metric dimension of two families of incidence graphs: incidence graphs of symmetric designs, and incidence graphs of symmetric transversal designs (i.e. symmetric nets). These graphs are the bipartite distance-regular graphs of diameter $3$, and the bipartite, antipodal distance-regular graphs of diameter $4$, respectively. In each case, we use the probabilistic method in the manner used by Babai to obtain bounds on the metric dimension of strongly regular graphs, and are able to show that $\mu(\Gamma)=O(\sqrt{n}\log n)$ (where $n$ is the number of vertices).

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.