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Integrity report for Highly Non-linear and Reliable Amorphous Silicon Based Back-to-Back Schottky Diode as Selector Device for Large Scale RRAM Arrays

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1605.02757 · pith:2016:4QO7DYFHM4ARSEUC2OJ6MYRQJQ

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Paper page arXiv integrity.json bundle.json

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Signed record

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