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Integrity report for Realistic inversion of diffraction data for an amorphous solid: the case of amorphous silicon

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1610.00065 · pith:2016:4RXOAMJEAINSR4ICIV5NR52RZH

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Paper page arXiv integrity.json bundle.json

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Signed record

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