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Integrity report for Thin film growth of a topological crystal insulator SnTe on the CdTe (111) surface by molecular beam epitaxy

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1605.02179 · pith:2016:4TEBGBR67SBVMCI6C7VSGVJCEN

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Paper page arXiv integrity.json bundle.json

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Signed record

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