Time-resolved force microscopy using delay-time modulation method

Atsushi Taninaka; Hidemi Shigekawa; Hiroyuki Mogi; Katsuya Iwaya; Osamu Takeuchi; Rin Wakabayashi; Shoji Yoshida; Takeshi Miura; Yusuke Arashida

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Time-resolved force microscopy using delay-time modulation method

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arxiv 2401.06359 v1 pith:4U4M6WWU submitted 2024-01-12 physics.app-ph physics.ins-detphysics.optics

Hiroyuki Mogi , Rin Wakabayashi , Shoji Yoshida , Yusuke Arashida , Atsushi Taninaka , Katsuya Iwaya , Takeshi Miura , Osamu Takeuchi

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Hidemi Shigekawa

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classification physics.app-phphysics.ins-detphysics.optics

keywords microscopyforcetime-resolvedmethodmodulationtunnelingatomicbulk

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We developed a time-resolved force microscopy technique by integrating atomic force microscopy using a tuning-fork-type cantilever with the delay time modulation method for optical pump-probe light. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers in bulk WSe2, which is challenging owing to the effect of tunneling current in time-resolved scanning tunneling microscopy. The obtained results were comprehensively explained with the model based on the dipole-dipole interaction induced by photo illumination.

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