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Integrity report for Analytical model for the intensity dependence of 1500 nm to 980 nm upconversion in Er³⁺: a new tool for material characterization

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1809.03908 · pith:2018:4XFJVS3O3XLHH2WVGPFVEKLHRZ

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Paper page arXiv integrity.json bundle.json

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Signed record

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