Integrity report for Thickness-Dependent Spintronic Terahertz Emission in MBE-Grown PtTe₂: From Semiconductor to Type-II Dirac Semimetal

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.22932 · pith:2026:5HZ253MEPJYRCMIZZNFLJP4HQI

0Critical

0Advisory

5Detectors run

2026-05-27Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

claim_evidence completed v1.0.0 · findings 0 · 2026-05-27 09:44:24.884544+00:00

doi_compliance completed v1.0.0 · findings 0 · 2026-05-27 06:03:44.642346+00:00

doi_title_agreement completed v1.0.0 · findings 0 · 2026-05-27 06:03:11.493891+00:00

cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-25 18:23:49.904085+00:00

ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-05-25 03:36:37.237003+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/5HZ253ME/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.