Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-07T01:04:46.361206Z
Paper Citation Record · LEDGER
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments
As of 21 August 2026, this Paper Citation Record lists 14 of 14 outbound references and 0 inbound Pith citation observations for arXiv:2506.12268.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-21T06:32:19.484+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
14 of 14 outbound references displayed
- verified exact0
- verified fuzzy12
- unresolved2
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation add169ae-8167-4f8a-ae61-0bebe2a4e535 · outbound
This paper cites Baulieu, et.al, J.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Baulieu, et.al, J
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.551190Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 06c6dde8-1384-4db1-a465-ee8305917610 · outbound
This paper cites Juillard, et.al, J.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Juillard, et.al, J
Reference 2
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.538554Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 71a715b3-76cb-4632-a469-6e577eea652a · outbound
This paper cites Phipps, Y.
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.526068Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 59577258-abe7-4515-b2a3-f1c8cbc2bb06 · outbound
This paper cites Anczarski, et.al, J Low Temp Phys 214, 256-262 (2024).
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Anczarski, et.al, J Low Temp Phys 214, 256-262 (2024)
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.513296Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation fa54dc94-80a6-4abc-bd3b-1ef9e7827b6a · outbound
This paper cites an unresolved cited work.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Unresolved cited work
Reference 5
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T01:04:46.500085Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation e58f962e-87d1-492a-9d9d-28039906bc3c · outbound
This paper cites Kalbitz, Wurth Elektronik, Appl.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Kalbitz, Wurth Elektronik, Appl
Reference 6
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.487724Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation c1bf3612-b921-450d-9b21-36c75d784651 · outbound
This paper cites Lee, et.al, J Korean Ceram Soc 49, 475-483 (2012).
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Lee, et.al, J Korean Ceram Soc 49, 475-483 (2012)
Reference 7
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.475118Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation c58bf5e5-704f-4c2c-9150-1a319d945f41 · outbound
This paper cites Design techniques for a stable operation of cryogenic field- programmable gate arrays.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Design techniques for a stable operation of cryogenic field- programmable gate arrays
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.460760Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 6c1498dc-d8d7-4eb6-ad67-c149d0a19b0e · outbound
This paper cites Teyssandier and D.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Teyssandier and D
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.446100Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation f9fb0fd8-972e-40bd-8bfa-c9cabcab4d41 · outbound
This paper cites Pan,Cryogenics 45, 463-467 (2005).
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Pan,Cryogenics 45, 463-467 (2005)
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.433020Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 09d8a38b-15cd-4ca1-8ea6-eac4d8d598a9 · outbound
This paper cites open” chan- nels (no component installed) and two others (Chs 8, 12) were selected as “short.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments open” chan- nels (no component installed) and two others (Chs 8, 12) were selected as “short
Reference 11
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.563827Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation d4b11771-cbc6-4e72-9407-0a1a710120d5 · outbound
This paper cites Novikov, D.
Reference 12
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.419991Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation b1d82060-49ea-413b-80c0-39087553dd0e · outbound
This paper cites an unresolved cited work.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Unresolved cited work
Reference 13
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T01:04:46.406914Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 71c06d81-5aff-408d-9240-e45b33f5a02c · outbound
This paper cites Teverovsky,IEEE Trans.
Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Teverovsky,IEEE Trans
Reference 14
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T01:04:46.393788Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Pith citing papers
No inbound Pith citation observations are available.