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Integrity report for Stability of low-carrier-density topological-insulator Bi₂Se₃ thin films and effect of capping layers

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1510.01804 · pith:2015:5MVM3BNFML4GY3FWGYME5HVVAG

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Paper page arXiv integrity.json bundle.json

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Signed record

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