Integrity report for Low-frequency Noise in Individual Carbon Nanotube Field-Effect Transistors with Top, Side and Back Gate Configurations: Effect of Gamma Irradiation

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1311.4312 · pith:2013:5OSHEVRFTHXPJAF6JR2R4FCYOH

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0Advisory

0Detectors run

—Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/5OSHEVRFTHXPJAF6JR2R4FCYOH/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.