Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-12T14:42:45.998416Z
Paper Citation Record · LEDGER
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices
As of 13 August 2026, this Paper Citation Record lists 7 of 7 outbound references and 0 inbound Pith citation observations for arXiv:2411.14970.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-12T06:34:41.77262+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
7 of 7 outbound references displayed
- verified exact2
- verified fuzzy1
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch4
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 31c25239-779f-49b9-9b9f-b2aeb0212930 · outbound
This paper cites filament and gap.
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices filament and gap
Reference 1
- Resolution
- verified exact
- raw_fallback, observed 2026-08-12T14:42:46.202734Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 4c99e3d6-83ce-407d-8a3a-d88ede6afeb7 · outbound
This paper cites Less important details which do not affect the conclusions reached in the main text are described here for completeness.
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices Less important details which do not affect the conclusions reached in the main text are described here for completeness
Reference 2
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-12T14:42:46.111764Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 86369908-b23b-4a95-b624-2ec89d5e29a4 · outbound
This paper cites 15 Figure 4 (a) and (b).
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices 15 Figure 4 (a) and (b)
Reference 4
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-12T14:42:46.427856Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 78643977-27fa-4f0a-bea7-4006f5b7344b · outbound
This paper cites (19) Huang, P.; Liu, X.
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices (19) Huang, P.; Liu, X
Reference 76
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-12T14:42:46.346790Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation bb242e99-431c-4f52-b712-e1e6cea2d38d · outbound
This paper cites (47) Wirth, K.
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices (47) Wirth, K
Reference 198
- Resolution
- verified exact
- doi, observed 2026-08-12T14:42:46.035081Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation ddc0fe03-c6de-4ccd-a64d-43186712c76e · outbound
This paper cites (36) Gries, U.
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices (36) Gries, U
Reference 1680
- Resolution
- metadata mismatch
- raw_fallback, observed 2026-08-12T14:42:46.277040Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 33ee3bb5-03cd-435a-ad1c-5ac6b7d824a1 · outbound
This paper cites High-Throughput Phase-Field Simulations and Machine Learning of Resistive Switching in Resistive Random-Access Memory.
Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices High-Throughput Phase-Field Simulations and Machine Learning of Resistive Switching in Resistive Random-Access Memory
Reference 2018
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T14:42:46.440802Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Pith citing papers
No inbound Pith citation observations are available.