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Integrity report for Nonlinear Near-Field Microwave Microscope For RF Defect Localization in Superconductors

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1008.2948 · pith:2010:6PYPC2DGABAUSMO2SPLMK2B75F

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Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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