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Integrity report for Controlled oxygen vacancy induced p-type conductivity in HfO{2-x} thin films

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1111.2785 · pith:2011:72UC65JCBQICPGPAWJEYKWOTMK

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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