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Integrity report for Studies on temperature dependent semiconductor to metal transitions in ZnO thin films sparsely doped with Al

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1202.3298 · pith:2012:7D4BQJSVXEYW4KE2ZV7BQRNGVR

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Paper page arXiv integrity.json bundle.json

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Signed record

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