Paper Citation Record · LEDGER

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale

As of 18 August 2026, this Paper Citation Record lists 11 of 11 outbound references and 0 inbound Pith citation observations for arXiv:2607.03588.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.03588 v1

Coverage vector

measured 11 of 11 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-07-12T01:22:19.077162Z

measured 11 of 11 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-17T06:30:58.91139+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

11 of 11 outbound references displayed

verified exact0
verified fuzzy0
unresolved9
parse uncertain0
malformed identifier2
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 43aa4e68-61a4-40e7-8ced-835f5e4a557d · outbound

This paper cites an unresolved cited work.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale Unresolved cited work

Reference 1

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 5594dcbf-3013-48a2-82eb-c4218cb2be09 · outbound

This paper cites lossless dilution.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale lossless dilution

Reference 2

Resolution: malformed identifier; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation eeadc7f1-c1a5-4445-a083-37a3cf34e2e5 · outbound

This paper cites an unresolved cited work.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale Unresolved cited work

Reference 3

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 0ef3b952-3615-4fe8-86ba-f3fd1d9bac1e · outbound

This paper cites In this step, the etch proceeded through the AlScN layer and stopped at the bottom Pt electrode, creating isolated islands and exposing the bottom contact.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale In this step, the etch proceeded through the AlScN layer and stopped at the bottom Pt electrode, creating isolated islands and exposing the bottom contact

Reference 4

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 240fb8c8-a007-47da-9449-748fcfb8c062 · outbound

This paper cites They feature a shaft diameter ranging from 80 nm to 100 nm (measured at a height of 50 nm above the apex).

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale They feature a shaft diameter ranging from 80 nm to 100 nm (measured at a height of 50 nm above the apex)

Reference 5

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 0754f5ea-e59d-409f-9c6b-db92594d3ef8 · outbound

This paper cites an unresolved cited work.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale Unresolved cited work

Reference 6

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8ed21db9-ebf5-4d4b-bcf5-4848c1e72d80 · outbound

This paper cites Conductive Fin.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale Conductive Fin

Reference 7

Resolution: malformed identifier; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 47af985d-55cf-4b2e-8cfc-c27deaa29161 · outbound

This paper cites Due to finite pixel resolution and the polygonal faceting inherent to electron-beam lithography at the deep sub-micrometer scale, a radial uncertainty of ±5 % was assigned.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale Due to finite pixel resolution and the polygonal faceting inherent to electron-beam lithography at the deep sub-micrometer scale, a radial uncertainty of ±5 % was assigned

Reference 8

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 492166a7-f744-44a2-8a29-205d4ef0bf07 · outbound

This paper cites an unresolved cited work.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale Unresolved cited work

Reference 9

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation edfc97ea-add7-4caf-b9b5-d4ad0016e5c1 · outbound

This paper cites Initial analysis of the raw, single-sweep traces for the deep sub-micrometer devices revealed a Signal-to-Noise Ratio (SNR) approaching unity.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale Initial analysis of the raw, single-sweep traces for the deep sub-micrometer devices revealed a Signal-to-Noise Ratio (SNR) approaching unity

Reference 10

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8a747582-12be-42cd-b838-438fdaa7406b · outbound

This paper cites butterfly.

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale butterfly

Reference 11

Resolution: unresolved; no resolver link, observed 2026-07-12T01:22:19.077162Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Pith citing papers

No inbound Pith citation observations are available.