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Physical limitations to the spatial resolution of solid-state detectors

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arxiv 1404.4535 v2 pith:7KOIC2RH submitted 2014-04-17 physics.ins-det hep-ex

classification physics.ins-dethep-ex
keywords resolutionsignalsolid-stateachievedchargeddeltadepositiondetec
verification ladder T0 review T1 audit T2 compute T3 formal
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abstract

In this paper we explore the effect of $\delta$-ray emission, fluctuations in th e signal deposition on the detection of charged particles in silicon-based detec tors. We show that these two effects ultimately limit the resolution that can be achieved by interpolation of the signal in finely segmented position-sensitive solid-state devices.

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