Integrity report for Remote Surface Roughness Scattering in FDSOI devices with high-kappa/SiO₂ gate stacks
A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.
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Paper page arXiv integrity.json bundle.json
Detector runs
Findings
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Signed record
The machine-readable record for this paper lives at /pith/AQGHJ7HZ/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.