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Integrity report for Highly Ordered Boron Nitride/Epigraphene Epitaxial Films on Silicon Carbide by Lateral Epitaxial Deposition

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2011.11184 · pith:2020:AVQ5W2WOYO3ZGNMLHNWRT73MNY

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Paper page arXiv integrity.json bundle.json

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Signed record

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