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Integrity report for Single-crystalline GaAs/Si Heterojunction Tunnel Diodes Interfaced by an Ultrathin Oxygen-enriched Layer

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arXiv:2409.15789 · pith:2024:BMSGPKTFIFP67BBSPX52JGCDYE

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Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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