Paper Citation Record · LEDGER

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage

As of 16 August 2026, this Paper Citation Record lists 22 of 22 outbound references and 0 inbound Pith citation observations for arXiv:2607.18420.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.18420 v1

Coverage vector

measured 22 of 22 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-01T15:33:58.982660Z

measured 22 of 22 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-16T06:30:59.297886+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

22 of 22 outbound references displayed

verified exact17
verified fuzzy0
unresolved5
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation e8789d64-61cf-4897-87cf-fed83c17e9f6 · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 1

Resolution: unresolved; no resolver link, observed 2026-08-01T15:33:56.087936Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation bf8522a9-4e36-40f8-9d48-408bcfad1db0 · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 2

Resolution: verified exact; doi, observed 2026-08-01T15:38:25.189692Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 78d2307b-9a4f-4fb3-80e6-3bf207951f69 · outbound

This paper cites Li , author Y.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Li , author Y

Reference 3

Resolution: verified exact; doi, observed 2026-08-01T15:38:25.112946Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 7d787c61-0fd0-436f-a388-ac6b9ccf899d · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 4

Resolution: verified exact; doi, observed 2026-08-01T15:38:25.014267Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 1660c3fa-227f-4de0-b70b-bcf7a56793bb · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 5

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.924858Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation fba242ab-b253-44ca-a069-4136fe6e4f7e · outbound

This paper cites Novotn\' y , author P.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Novotn\' y , author P

Reference 6

Resolution: unresolved; no resolver link, observed 2026-08-01T15:33:56.808490Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation fb803335-546b-414c-b8e0-857f7a9e6a2c · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 7

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.846051Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 5aec7702-b496-45af-a8f2-061bab4f7e7d · outbound

This paper cites Uchiyama , author Y.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Uchiyama , author Y

Reference 8

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.797880Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation c647d194-62b4-451c-a236-66228203a8b6 · outbound

This paper cites Vergara , author L.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Vergara , author L

Reference 9

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.745206Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 2b5d498d-394b-44e5-95fb-cdd95691b65d · outbound

This paper cites Liu , author P.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Liu , author P

Reference 10

Resolution: unresolved; no resolver link, observed 2026-08-01T15:33:57.241250Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 38330cd2-7b18-4f9f-9a3f-f34b0223c602 · outbound

This paper cites Liu , author M.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Liu , author M

Reference 11

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.683175Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation e9934cce-0e19-4aed-b8b0-6055b2a17103 · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 12

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.571199Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation efb1cd03-d0f7-4231-a636-bd27ed398b25 · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 13

Resolution: unresolved; no resolver link, observed 2026-08-01T15:33:57.464593Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 2d20f09d-8efc-47d1-9b99-09a751e7af05 · outbound

This paper cites Kronik \ and\ author Y.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Kronik \ and\ author Y

Reference 14

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.514118Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 6f6a6714-0b43-432b-a4d4-908d50b1ddb6 · outbound

This paper cites Mulhollan , author A.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Mulhollan , author A

Reference 15

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.421492Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 054b54be-cea6-46ae-b75a-90f69cfd5fc6 · outbound

This paper cites Liu , author F.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Liu , author F

Reference 16

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.347098Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 15274abc-4593-45af-b702-d736765398cd · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 17

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.258019Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 66c0a66d-9476-41a9-95a3-9b27076142e9 · outbound

This paper cites Rhoderick ,\ @noop title Metal-semiconductor Contacts ,\ Monographs in electrical and electronic engineering\ ( publisher Clarendon Press ,\ year 1978 ) NoStop.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Rhoderick ,\ @noop title Metal-semiconductor Contacts ,\ Monographs in electrical and electronic engineering\ ( publisher Clarendon Press ,\ year 1978 ) NoStop

Reference 18

Resolution: unresolved; no resolver link, observed 2026-08-01T15:33:58.284919Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation bf8acfb5-0ea0-4c92-ada4-674a58dc182c · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 19

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.180694Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation b96b2616-a454-4da4-b021-18eb110f813c · outbound

This paper cites Sumiya , author Y.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Sumiya , author Y

Reference 20

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.124691Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 35844693-20a7-4d59-afcf-ee466ad096aa · outbound

This paper cites Sauty , author C.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Sauty , author C

Reference 21

Resolution: verified exact; doi, observed 2026-08-01T15:38:24.080249Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation c62c2498-2397-40cf-9254-0f53518d181a · outbound

This paper cites an unresolved cited work.

Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage Unresolved cited work

Reference 22

Resolution: verified exact; doi, observed 2026-08-01T15:38:23.976749Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Pith citing papers

No inbound Pith citation observations are available.