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Integrity report for Probing limits of STM field emission patterned Si:P δ-doped devices

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1408.0697 · pith:2014:DAUXHIDAJI4YTWCHASUA3HIDNS

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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