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Integrity report for Curvature Effects on Optical Response of Si nanocrystals in SiO2 having Interface Silicon Suboxides

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:0903.3954 · pith:2009:DZ5VOBRG5IGDVPVISDVYWXZ7BE

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Paper page arXiv integrity.json bundle.json

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Signed record

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