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Integrity report for Influence of stoichiometry on interfacial conductance in LaAlO₃/SrTiO₃ grown by 90^o off-axis sputtering

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1811.00953 · pith:2018:EET2H4V5TF54BCZ76STCZDIJ45

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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