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Paper Integrity Record · LEDGER

Selective thermal evolution of native oxide layer in Nb and Nb3Sn-coated SRF grade Nb: An in-situ angular XPS study

As of an unrecorded date, Pith completed 0 of 0 listed checks against arXiv:2304.06112. No listed check completed, so this record makes no findings claim.

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pith.integrity.v1
2304.06112 v1
pith:2023:EJFEKVJUV2S4GS3RO6NBW6M4II

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