Paper Citation Record · LEDGER

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements

As of 16 August 2026, this Paper Citation Record lists 28 of 28 outbound references and 0 inbound Pith citation observations for arXiv:1908.06516.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
1908.06516 v1

Coverage vector

measured 28 of 28 reference resolution

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Source: paper_references, paper_reference_links, observed 2026-08-14T12:49:34.130758Z

measured 28 of 28 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-16T06:30:59.297886+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

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measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

28 of 28 outbound references displayed

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verified fuzzy19
unresolved9
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External citation measurements

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Outbound references

Observation ef51c299-47fa-40e0-a8ee-b6523a8f504a · outbound

This paper cites e.,µ is temperature-independent).

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements e.,µ is temperature-independent)

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.522971Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 9bab84e3-bba5-44b1-ae08-d3851d509aab · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 2

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.468176Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 924f6807-ee2b-4b6b-9890-7843d484d678 · outbound

This paper cites The respective MNR energies for σ are:.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements The respective MNR energies for σ are:

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.508363Z

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No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation bf08f69a-d7c3-4eeb-be23-3b552ceff009 · outbound

This paper cites the conductivity in a-Si:H exhibits a MNR because the statistical shift causes the carrier density to follow a MNR as well as the mobility.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements the conductivity in a-Si:H exhibits a MNR because the statistical shift causes the carrier density to follow a MNR as well as the mobility

Reference 4

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.494636Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation a7ab7abc-40e6-4687-8c64-74fa97749f77 · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 5

Resolution: unresolved; no resolver link, observed 2026-08-14T12:49:34.030900Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 9ce89c81-3bba-4fde-a28b-f57c98c2536b · outbound

This paper cites Kondo, Y.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Kondo, Y

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.415804Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 341ea4b4-c2ea-4aac-be56-2bf93d3595da · outbound

This paper cites Thomas and H.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Thomas and H

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.455022Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation be1a60ab-9873-4171-ba29-5eb4695a672c · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 8

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.442165Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 0fe9b18f-fa81-43f8-b382-bda06200a380 · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 9

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.429261Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 2bfc386b-c0c7-40cd-856d-eec3fce167d5 · outbound

This paper cites Irsigler, D.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Irsigler, D

Reference 10

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.363672Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 1d9028cb-b5a4-4300-9f97-8525854d2289 · outbound

This paper cites Overhof and W.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Overhof and W

Reference 11

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.402549Z

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No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 5b718321-027d-41c3-bb0d-07b471b8d04f · outbound

This paper cites Overhof and W.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Overhof and W

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.389742Z

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No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation a1462298-6524-4cfe-a62d-8efbac44619a · outbound

This paper cites Beyer and H.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Beyer and H

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.376419Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 754141e1-1e00-4799-a6e8-f0f2de63e9fc · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 14

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.308527Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 414549b5-8cef-46a5-8d33-055cdd78c8a7 · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 15

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.536432Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 5f135cb7-5575-48c9-a160-55361bad5401 · outbound

This paper cites Astakhov, R.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Astakhov, R

Reference 16

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.349793Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation cb375673-fe6a-4f8e-8f66-0b1e9048f5ae · outbound

This paper cites Finger, O.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Finger, O

Reference 17

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.335213Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation d0c596e0-5387-4175-80d1-3d2b644c7ad6 · outbound

This paper cites Bronger and R.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Bronger and R

Reference 18

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.322352Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation aadb13f2-d8a8-4e84-aaa2-48ff4ca505c6 · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 19

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.293756Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation cd4e697b-7472-4feb-9f64-c4191b0eea4f · outbound

This paper cites Werner, Solid State Phenomena 37, 213 (1994).

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Werner, Solid State Phenomena 37, 213 (1994)

Reference 20

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.279985Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 998f0839-a0cf-4510-a057-7f540ffc5c55 · outbound

This paper cites Bronger, Electronic properties of µc-Si:H layers investigated with Hall measurements , Ph.D.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Bronger, Electronic properties of µc-Si:H layers investigated with Hall measurements , Ph.D

Reference 21

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.266693Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 968a0ff5-20f8-4ec6-99ad-248f008c1ecd · outbound

This paper cites Carius, F.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Carius, F

Reference 22

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.252680Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 6ffc11a6-a8a0-4b7b-b04e-b527692a2524 · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 23

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.237600Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 12cf4770-2c06-4ca2-92a4-a4ea4ad175a3 · outbound

This paper cites Carius, J.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Carius, J

Reference 24

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.223492Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 56d86052-21ee-4904-8ef9-a4d538a562c8 · outbound

This paper cites Lucovsky, C.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Lucovsky, C

Reference 25

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.210113Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation 56568e73-66fa-4f21-9821-e80f9d939aaf · outbound

This paper cites Meiling and R.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Meiling and R

Reference 26

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.195853Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation c1c046d4-6754-4a37-921c-9703752a8874 · outbound

This paper cites an unresolved cited work.

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Unresolved cited work

Reference 27

Resolution: unresolved; raw_fallback, observed 2026-08-14T12:49:34.180827Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

Observation c92d06ff-82cb-4107-b67a-8d270fce3939 · outbound

This paper cites Jackson, Physical Review B 38, 3595 (1988).

Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements Jackson, Physical Review B 38, 3595 (1988)

Reference 28

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T12:49:34.166282Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.

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