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Integrity report for Resilient Growth of Highly Crystalline Topological Insulator-Superconductor Heterostructure Enabled by Ex-situ Nitride Film

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arXiv:2406.06112 · pith:2024:EZ2R3N57TKEESV6GRMVXW7NVAJ

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Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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