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Integrity report for Growth of alpha-beta phase W thin films over steep Al topography in a confocal sputtering machine

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1410.2611 · pith:2014:EZD5UFY454DZSRSHT3ZEZ62WFD

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Paper page arXiv integrity.json bundle.json

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Signed record

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