Integrity report for Structured Back Gates for High-Mobility Two-Dimensional Electron Systems Using Oxygen Ion Implantation

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1601.01889 · pith:2016:FMSLROYLS5H566VFVXIRPXM5AS

0Critical

0Advisory

0Detectors run

—Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/FMSLROYLS5H566VFVXIRPXM5AS/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.