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Integrity report for Current-induced switching of thin film α-Fe₂O₃ devices imaged using a scanning single-spin microscope

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2210.06233 · pith:2022:FR43CAGAJ4IFDXPTJRBK4W5X3O

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