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Integrity report for Sub-1-us, Sub-20-nJ Pattern Classification in a Mixed-Signal Circuit Based on Embedded 180-nm Floating-Gate Memory Cell Arrays

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1610.02091 · pith:2016:GK2S3BKWS3AEW343L4VKBSHAF5

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Paper page arXiv integrity.json bundle.json

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Signed record

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